Dependence of the Characteristics of Mo Films on Sputter Conditions [electronic resource].
Published
Washington, D.C. : United States. Dept. of Energy, 2000. Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
The residual stress, resistance, orientation, and microstructure of sputtered Mo films were studied as a function of varied-deposition power and pressure.
Published through SciTech Connect. 01/01/2000. Program and Proceedings: NCPV Program Review Meeting 2000, 16-19 April 2000, Denver, Colorado; NREL/BK-520-28064. Noufi, R.; Hasoon, F.; Moutinho, H.; Al-Jassim, M. M.; Alleman, J. L.; Althani, H.