Amorphization kinetics of Zr{sub 3}Fe under electron irradiation [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy, 1992.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:: 16 pages : digital, PDF file
Additional Creators:: Argonne National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

0.9 MeV electron irradiations were performed at 28--220 K in a high-voltage electron microscope (HVEM). By measuring onset, spread and final size of the amorphous region, factoring in the Guassian distribution of the beam, a kinetic description of the amorphization in terms of dose, dose rate and temperature was obtained. The critical temperature for amorphization by electron irradiation was found to be ∼220 K, compared to 570--625 K for ⁴°Ar ion irradiation. Also, the dose-to-amorphization increased exponentially with temperature. Results indicated that the rate of growth of the amorphous region under the electron beam decreased with increasing temperature and the does-to-amorphization decreased with increasing dose rate. The size of the amorphous region saturated after a region dose, the final size decreasing with increasing temperature, and it was argued that this is related to the existence of a critical dose rate, which increased with temperature, below which no amorphization occurred. The above observations can be understood in the framework of the kinetics of damage accumulation under irradiation.

Report Numbers:

E 1.99:anl/msd/cp--77644
E 1.99: conf-920970--10
conf-920970--10
anl/msd/cp--77644

Subject(s):

Materials Science

Other Subject(s):

Note:

Published through SciTech Connect.
10/01/1992.
"anl/msd/cp--77644"
" conf-920970--10"
"DE94011520"
3. conference on evolution of microstructure in metals during irradiation,Chalk River (Canada),29 Sep - 2 Oct 1992.
Okamoto, P.R.; Motta, A.T.; Howe, L.M.

Funding Information:

W-31109-ENG-38

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