Microanalysis at the atomic level [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1995.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 9 pages : digital, PDF file
- Additional Creators:
- Oak Ridge National Laboratory
United States. Department of Energy
United States. Department of Energy. Office of Scientific and Technical Information
- The optical arrangement of the high-resolution scanning transmission electron microscope (STEM) allows incoherent imaging conditions to be established simultaneously for both elastically and inelastically scattered electrons, with good detection efficiencies. For zone axis illumination and localized inelastic transitions, both images show a resolution governed by the incident probe intensity profile, with maximum intensity occurring when the probe is located over the atomic columns. The high intensity elastic signal may therefore be used as an atomic resolution reference image for the low intensity inelastic signal, allowing spectroscopy to be achieved from selected atomic columns or planes. The potential of this approach in a 300-kV STEM is discussed. This technique was used to determine the interfacial structure in SrTiO₃ and ZrO₂/NiO.
- Published through SciTech Connect.
Conference of the Electron Microscopy and Analysis Group of the Institute of Physics: recent advances in electron microscopy and related microanalytical techniques, Birmingham (United Kingdom), 12-15 Sep 1995.
Pennycook, S.J.; Browning, N.D.; Nellist, P.D.; McGibbon, M.M.; McGibbon, A.J.; Jesson, D.E.
- Funding Information:
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