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The MBE growth and optical quality of BaTiO{sub 3} and SrTiO{sub 3} thin films on MgO [electronic resource].

Published
Washington, D.C. : United States. Dept. of Defense, 1994.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
7 pages : digital, PDF file
Additional Creators
Oak Ridge National Laboratory, United States. Department of Defense, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
High quality epitaxial BaTiO₃ and SrTiO₃ have been grown on MgO; stabilized at a one unit cell height; and grown to film thicknesses of 0.5--0.7 μm. These relatively thick films remain adherent when thermally cycled between growth temperatures and room temperature, are crack free with high optical quality, and have both in-plane and out-of-plane X-ray rocking curves of 0.3--0.5°. These films have been grown using molecular beam epitaxy (MBE) methods starting with the TiO₂ layer of the perovskite structure. The TiO₂-layer/MgO interface uniquely satisfies electrostatic requirements for perovskite heteroepitaxy and provides the template structure that leads to the high quality films that are obtained. Wavelength dependence of optical loss has been characterized between 475 nm and 705 nm with loss coefficients < l dB/cm being obtained at the He-Ne wavelength.
Report Numbers
E 1.99:conf-940411--16
conf-940411--16
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
05/01/1994.
"conf-940411--16"
"DE94011468"
": 1854-A077-A1"
"AFOSR-ISSA-92-0003"
"1692-C123-A1"
"WRDC FY1457-92-N5024"
Spring meeting of the Materials Research Society (MRS),San Francisco, CA (United States),4-8 Apr 1994.
Walker, F.J.; McKee, R.A.; Alexander, K.B.; Specht, E.D.
Funding Information
AC05-84OR21400
View MARC record | catkey: 14457262