The variability residual stresses of thick superconductor films during orthorhombic to tetragonal transformation [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1992.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- Pages: (9 pages) : digital, PDF file
- Additional Creators:
- Argonne National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- YBa₂Cu₃Oₓ thick films have been deposited by spray pyrolysis of a sol-gel on 10 cm diameter polycrystalline MgO wafers. The film thickness was built up in layers of approximately 1 μm thick. The in-plane residual stresses were measured by an optical interferometry (shadow moire) method as a function of film structure. In-plane residual stress maps over the area of the wafer have been obtained. The average stress of the 5 μm orthorhombic phase was 0.84 GPa. As the film transforms from the orthorhombic to the tetragonal structure, the tensile stresses decreased by 0.5 GPa.
- Report Numbers:
- E 1.99:anl/cp-75687
E 1.99: conf-9203110--2
- Published through SciTech Connect.
8. international conference on advanced science and technology, Argonne, IL (United States), 28 Mar 1992.
Danyluk, S. . Dept. of Civil Engineering; Lanagan, M.T.; Poeppel, R.B.; Wu, W.
- Funding Information:
View MARC record | catkey: 14458896