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Determination of the specific site occupation of rare earth additions in Y/sub 1/ /sub 7/SM/sub 0/ /sub 6/Lu/sub 0/ /sub 7/Fe/sub 5/O/sub 12/ thin films by the orientation dependence of characteristic x-ray emissions [electronic resource].

Published
Berkeley, Calif. : Lawrence Berkeley National Laboratory, 1983.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
Pages: 14 : digital, PDF file
Additional Creators
Lawrence Berkeley National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
The orientation dependence of characteristic x-ray emissions have been used to determine specific site occupations of Rare Earth additions in epitaxially grown films of Y/sub 1/ /sub 7/Sm/sub 0/ /sub 6/Lu/sub 0/ /sub 7/Fe/sub 5/O/sub 12/. A theoretical formulation based on the assumption of highly localized inner shell excitations was used not only to predict specific site sensitive orientations, but also to refine experimentally observed data employing a constrained least squares analysis to give probabilities for the occupation of the RE additions in the different crystallographic sites. Thus, it has been shown that in this compound the preference for the RE additions is a predominantly octahedral occupation with a probability greater than or equal to 95%. Some of the assumptions and limitations of the technique have also been discussed.
Report Numbers
E 1.99:lbl-16884
E 1.99: conf-831174-54
conf-831174-54
lbl-16884
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
11/01/1983.
"lbl-16884"
" conf-831174-54"
"DE84004632"
Materials Research Society annual meeting, Boston, MA, USA, 14 Nov 1983.
Thomas, G.; Rez, P.; Mishra, R.; Krishnan, K.M.
Funding Information
AC03-76SF00098
View MARC record | catkey: 14459442