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In-situ Rutherford backscattering analysis of radiation-induced segregation [electronic resource].

Published
Argonne, Ill. : Argonne National Laboratory, 1981.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
Pages: 16 : digital, PDF file
Additional Creators
Argonne National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
Composition changes were measured near the irradiated surfaces of binary Ni-based alloys during He and Kr irradiations using high-resolution Rutherford Backscattering Spectrometry (RBS). For the He irradiation, backscattered ions from the beam that was employed for the production of defects were used for simultaneous RBS analysis of the near-surface composition. These in-situ measurements of composition changes during irradiation at elevated temperature provide quantitative information on the kinetics of RIS. This paper demonstrates the use of the in-situ RBS technique to measure RIS in different alloys and show examples of the type of kinetic information that can be obtained. The versatility of the technique is demonstrated by presenting results on alloys for which the solute atomic mass is greater than (Ni-Ge), less than (Ni-Si), and nearly the same as (Cu-Ni) that of the host atoms. RIS results obtained for Kr and He irradiations of Ni-Si are also compared to illustrate the effect of the different primary recoil spectra on the kinetics of RIS.
Report Numbers
E 1.99:conf-810728-11
conf-810728-11
Subject(s)
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Note
Published through SciTech Connect.
06/01/1981.
"conf-810728-11"
"DE83010597"
9. international conference on atomic collisions in solids, Lyon, France, 6 Jul 1981.
Wagner, W.; Rehn, L.E.; Okamoto, P.R.; Averback, R.S.; Wiedersich, H.
Funding Information
W-31-109-ENG-38
View MARC record | catkey: 14459844