Microstructure of epitaxial YBa sub 2 Cu sub 3 O sub 7 thin films [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy, 1990.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:: Pages: (18 pages) : digital, PDF file
Additional Creators:: Los Alamos National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

Thin epitaxial films of YBa₂Cu₃O₇ on single crystal substrates have been prepared in situ by laser ablation and by post situ annealing of evaporated films of Cu, Y and BaF₂. Substrates include (001) SrTiO₃, LaGaO₃, and LaAlO₃. For both in situ and post situ annealed films, epitaxial (001) grains of YBa₂Cu₃O₇ form near the substrate but (100) and (010) grains tend to nucleate for thicknesses greater than ∼0.5μm. 90° grain boundaries are therefore common, as well as other defects such as small angle boundaries dislocations and stacking faults. High resolution electron microscopy of the substrate/superconductor interface shows regions of perfect epitaxy, distorted areas, amorphous regions and areas of interdiffusion. The relationship of observed microstructure to critical current density is discussed. 21 refs., 15 figs.

Report Numbers:

E 1.99:la-ur-91-887
E 1.99: conf-901125--11
conf-901125--11
la-ur-91-887

Subject(s):

Materials Science

Other Subject(s):

Note:

Published through SciTech Connect.
01/01/1990.
"la-ur-91-887"
" conf-901125--11"
"DE91009951"
2. international ceramic science and technology congress, Orlando, FL (USA), 12-15 Nov 1990.
Mitchell, T.E.

Funding Information:

W-7405-ENG-36

View MARC record | catkey: 14460392