Actions for Detection of faceting on (hk0) surfaces of thin gold films by diffraction in the electron microscope at 100 KV [electronic resource].

Email RIS file
Bookmark
Report an Issue

Detection of faceting on (hk0) surfaces of thin gold films by diffraction in the electron microscope at 100 KV [electronic resource].

Published
Washington, D.C : United States. Energy Research and Development Administration, 1977.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
Pages: 14 : digital, PDF file
Additional Creators
United States. Energy Research and Development Administration and United States. Department of Energy. Office of Scientific and Technical Information
Access Online

Availability

I Want It
I Want It

Finding items...

Restrictions on Access
Free-to-read Unrestricted online access
Summary
A series of single crystal thin films of gold with (hk0) surfaces ranging between (100) and (310), grown by vapor deposition, was studied in transmission in the electron microscope at 100 kV. For specimens intermediate between (100) and (310) both bright and dark field images contained line structure running parallel to (001). In certain cases segments were observed lying at 45/sup 0/ and 90/sup 0/ to these lines. Diffraction patterns from these specimens revealed relrods at each reciprocal lattice point running parallel to (100) and (310). In certain cases (301) and (30 anti 1) relrods were also present. No line structure or relrods were detectable for the specimens with (100) or (310) surfaces. The results are consistent with a model in which the (100) and (310) surfaces are essentially flat but surfaces with intermediate orientations consist of appropriate mixtures of (100) and (310) facets plus (301) and (30 anti 1) facets in certain cases. The line structure in the images is attributed to ''thickness contrast'' arising from variations in the specimen thickness due to the facets. The relrods are well explained by the specimen form factor as originally proposed by v. Laue. The results prove that faceted structures on thin film surfaces can be conveniently and systematically studied under certain conditions by conventional transmission electron microscopy at 100 kV.
Report Numbers
E 1.99:coo--2679-9
coo--2679-9
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
07/01/1977.
"coo--2679-9"
Balluffi, R. W.; Darby, T. P.; Guan, D. Y.
Cornell Univ., Ithaca, NY (USA)
Funding Information
EY-76-S-02-2679
View MARC record | catkey: 14460612