Toward more accurate loss tangent measurements in reentrant cavities [electronic resource].
- Published
- Washington, D.C. : United States. Dept. of Energy, 1980.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- Pages: 36 : digital, PDF file
- Additional Creators
- United States. Department of Energy and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- Karpova has described an absolute method for measurement of dielectric properties of a solid in a coaxial reentrant cavity. His cavity resonance equation yields very accurate results for dielectric constants. However, he presented only approximate expressions for the loss tangent. This report presents more exact expressions for that quantity and summarizes some experimental results.
- Report Numbers
- E 1.99:sand-80-0365
sand-80-0365 - Subject(s)
- Other Subject(s)
- Cavity Resonators
- Dielectric Properties
- Nylon
- Polystyrene
- Silica
- Teflon
- Chalcogenides
- Electrical Properties
- Electronic Equipment
- Fluorinated Aliphatic Hydrocarbons
- Halogenated Aliphatic Hydrocarbons
- Minerals
- Organic Compounds
- Organic Fluorine Compounds
- Organic Halogen Compounds
- Organic Polymers
- Oxides
- Oxygen Compounds
- Petrochemicals
- Petroleum Products
- Physical Properties
- Plastics
- Polyamides
- Polyethylenes
- Polymers
- Polyolefins
- Polytetrafluoroethylene
- Polyvinyls
- Resonators
- Silicon Compounds
- Silicon Oxides
- Note
- Published through SciTech Connect.
05/01/1980.
"sand-80-0365"
Moyer, R. D.
Sandia Labs., Albuquerque, NM (USA) - Funding Information
- AC04-76DP00789
View MARC record | catkey: 14461563