Actions for Interface control of electrical, chemical, and mechanical properties : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A.

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Interface control of electrical, chemical, and mechanical properties : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A. / editors: S.P. Murarka [and others].

Published
Pittsburgh : Materials Research Society, [1994]
Copyright Date
©1994
Physical Description
xxix, 728 pages : illustrations ; 24 cm.
Additional Creators
Murarka, S. P. and Materials Research Society. Fall Meeting (1993. : Boston, Mass)
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Contents
Machine generated contents note: Materials Research Society Symposium Proceedings -- SIA Roadmap and Semiconductor Materials Requirements / T. E. Seidel -- Material Innovations for Flexible Programmable and Intelligent ULSI System in 21st Century / Tadahiro Ohmi -- Relationship Between Interface Structure and Schottky Barrier Height / R. T. Tung / J. P. Sullivan / F. Schrey -- In-Situ Characterization of Growth and Intermixing at a Heteroepitaxial Interface: Fe on Au(001) / Q. Jiang / A. Chan / Y.-L. He / G.-C. Wang -- Alignment of Adsorbate-Induced Defects on Silicon(001) 2x1 Observed with STM / J. V. Seiple / J. P. Pelz -- Diffusion-Segregation Equation for Simulation in Heterostructures / R. Gafiteanu / H.-M. You / U. Goesele / T. Y. Tan -- Electrical, Magnetic and Mechanical Properties of Nanocrystalline Nickel / M. J. Aus / B. Szpunar / U. Erb / G. Palumbo / K. T. Aust -- The Model for Description of Electrical Properties of Polymerization-Filled Composite Materials / I. A. Tchmutin / A. T. Ponomarenko / V. G. Shevchenko -- Ellipsometric Study of the Interface Between Silicon and Silica / R. H. Doremus / S. C. Kao -- Structural Imperfections in Ultrathin Oxides Grown on Hydrogen Terminated Silicon Surfaces / Takeo Hattori / Kazuaki Ohishi -- On the Mechanism of Ultra Thin Silicon Oxide Film Growth During Thermal Oxidation / E. P. Gusev / H. C. Lu / T. Gustafsson / E. Garfunkel -- X-Ray Studies of Low-Temperature Grown SiO[subscript 2] on Si / J.-M. Baribeau / D. Landheer / J. A. Bardwell / K. B. Clark / R. L. Headrick -- Control of Si-SiO[subscript 2] Interface Properties in MOS Devices Prepared by Plasma-Assisted and Rapid Thermal Processes / G. Lucovsky / T. Yasuda / Y. Ma / S. V. Hattangady / X.-L. Xu / V. Misra / B. Hornung / J. J. Wortman -- Mechanism of O[subscript 2] Molecule Adsorption and Subsequent Oxidation of Dimers on Si(001) Surfaces / T. Hoshino / M. Tsuda / S. Oikawa / I. Ohdomari -- Characterization of Thin Chemical/Native Oxides on Si (100) by Auger and Angle-Resolved XPS / Eddie D. Pylant / Carolyn F. Hoener / Mark F. Arendt / Bob Witowski -- Oxidation of Si via Solid State Interfacial Reaction with Deposited Sn-Doped In[subscript 2]O[subscript 3] / Cleva W. Ow Yang / Yuzo Shigesato / David C. Paine -- Hot Electron Phenomena in Transport Across Metal-Semiconductor Structures / R. Ludeke / A. Bauer -- Formation of Chemically Clean and Morphologically Smooth PtSi/Si Interfaces / Suhit R. Das / D.-X. Xu / J. Phillips / J. McCaffrey / L. LeBrun / A. Naem -- Parameter Extraction from the Reverse I-V and C-V Characteristics of an Epitaxial p-InP/Au Schottky Diode / A. Singh / P. Cova / R. A. Masut -- The Interface for Cryogenic-Processed Metal/InP / L. He / W. A. Anderson / J. Palmer / Z. Shi -- An Investigation of the Al/n-GaAs Diodes with High Schottky Barrier Heights / C.-P. Chen / Y. A. Chang / T. F. Kuech -- Electrical Modelling and Characterisation of Alloyed Ohmic Contacts / Geoffrey K. Reeves / Patrick W. Leech / H. Barry Harrison -- An Initial Investigation of the Electrical and Microstructural Properties of Au/Ti and Au/Pd/Ti Ohmic Contact Structures for AlGaAs/GaAs HBTs / Kuldip S. Sandhu / Anne E. Staton-Bevan / Bernard M. Henry / Mark A. Crouch / Sukhdev S. Gill -- Ultra-Low Resistance Ni-Based Contacts to n-InP: The Dependence of Contact Resistivity on the Condition of the Metal-Semiconductor Interface / Navid S. Fatemi / Victor G. Weizer -- Shallow Ohmic Contacts to p-InGaAs Based on Pd/Ge with Implanted Zn or Cd / P. Ressel / H. Strusny / D. Fritzsche / H. Krautle / K. Mause -- Ohmic Contacts to p-Type InGaAs/InP with a Graded Bandgap Heterobarrier / Patrick W. Leech / Geoffrey K. Reeves -- Segregant-Assisted Growth of SiGe/Si Heterostructures and Their Optical Properties / Y. Shiraki / S. Fukatsu / K. Fujita / T. Usami -- Initial Stage of Heteroepitaxial Growth of SiC on Si by Gas Source MBE Using Hydrocarbon Radicals / Takashi Fuyuki / Yoichiro Tarui / Tomoaki Hatayama / Hiroyuki Matsunami -- Molecular Beam Epitaxy of ZnS Films on Arsenic Passivated Silicon Surfaces / Xiaochuan Zhou / Wiley P. Kirk -- Growth of CdTe on GaAs and Si Substrates by Organometallic Vapor Phase Epitaxy / Ishwara Bhat -- Changing PL Intensity from GaAs/Al[subscript 0.3]Ga[subscript 0.7]As Heterostructures Due to the Chemisorption of SO[subscript 2]: Effects of Heterostructure Geometry / J. F. Geisz / T. F. Kuech / A. B. Ellis -- Improved Adhesion of P-Doped SiO[subscript 2]-Interface Layers on InP by Low-Temperature Damage-Free Plasma-CVD / R. Riemenschneider / H. L. Hartnagel / H. Krautle -- Stability of Sulfide Passivated Gallium Arsenide Surfaces / J. S. Solomon / L. Petry / S. R. Smith -- Mechanistic Study of the Deposition of Metals from HF Solutions Onto Silicon Wafers / H. G. Parks / J. B. Hiskey / K. Yoneshige -- Ab Initio Molecular Dynamics Study of Al, Ga and Si Adsorption on the Si(001) Surface / T. Yamasaki / M. Ikeda / Y. Morikawa / K. Terakura -- The Effects of Chemical Vapor Cleaning Chemistries on Silicon Surfaces / S. E. Beck / A. G. Gilicinski / B. S. Felker / J. G. Langan / D. A. Bohling / M. A. George / J. C. Ivankovits / R. M. Rynders -- Surface Cleaning for Silicon Epitaxy Using Photoexcited Fluorine Gas / Takayuki Aoyama / Tatsuya Yamazaki / Takashi Ito -- Thermally Driven In-Situ Removal of Native Oxide Using Anhydrous Hydrogen Fluoride / Pushkar P. Apte / Heungsoo Park / Krishna C. Saraswat / C. R. Helms -- Chemical Modification of Surface Steps on Si(111) Vicinal Wafers: A Bonding Model for Phase Changes in Second Harmonic Generation / Z. Jing / G. Lucovsky / J. L. Whitten -- Atomic Scale Control of Si(001) Surface by Wet-Chemical Treatment / Yukinori Morita / Hiroshi Tokumoto -- Structural and Electrical Characterization of Hydrophobic Direct-Bonded Silicon Interfaces / Gordon Tam / F. Secco d'Aragona / N. David Theodore -- Rapid Evaluation of Thin Film Interfacial Reactions Using Temperature-Ramped Measurements / J. M. E. Harper / L. A. Clevenger / E. G. Colgan / C. Cabral, Jr. / B. Arcot -- Ultra Thin Sacrificial Diffusion Barriers - Control of Diffusion Across the Cu-SiO[subscript 2] Interface / Eric Kirchner / S. P. Murarka / E. Eisenbraun / A. Kaloyeros -- Adhesion Strength of Cu Polyimide Measured by Continuous Micro-Wedge Scratch Test / F. Wang / J. C. Nelson / H. Huang / M. de Boer / W. W. Gerberich / R. L. Swisher -- Thermal and Electromigration Effects on the Surface and Aluminum/Aluminum Oxide Interface of Aluminum Metallizations / George O. Ramseyer / Joseph V. Beasock / William K. Sylla / Lois H. Walsh -- TEM Studies of Plasma Deposited Tungsten and Tungsten Nitride Barriers for Thermally Stable Metallization / Chang Woo Lee / Yong Tae Kim / Suk-Ki Min / Choochon Lee / Jeong Yong Lee / Young Wook Park -- Processing High Quality Toughened Zirconia Ceramics by Controlling the Chemistry at the Particle-Particle Interface / S. T. Thuraisingham / J. L. Henshall -- Interfacial Cohesion Control by Solute Segregation / Jian-Sheng Wang -- Structural and Film Stress Investigation of the Interfacial Reaction in Al/SiC Microlaminates / R. B. Inturi / M. Chinmulgund / M. Shamsuzzoha / J. A. Barnard -- XPS and SEM Characterization of Pan-Based Carbon Fibers Treated in Oxygen and Nitric Oxide Plasmas / R. J. Smiley / W. N. Delgass -- Stress Evolution in Thin Film NiTi Shape Memory Alloys / Quanmin Su / Tasung Kim / Manfred Wuttig -- Interfacial Compatibility of Ti[subscript 3]Al with Various Ceramic Reinforcements / Weimin Si / Pengxing Li / Renjie Wu -- Control of Interfacial Mechanical Properties in Ti/Al[subscript 2]O[subscript 3] Composites / Hsin-Fu Wang / William W. Gerberich / Jim E. Angelo / Mike J. Mills -- Improved Mechanical Strengths of Epoxy Composites Obtained from Ion Beam Treated Carbon Fibers / Sin-Shong Lin / Pearl W. Yip -- Bond Strength of Pressed Composites / Donald A. Wiegand -- Influence of Segregation Effects on the Energies of Lead/Graphite and Gold/Graphite Interfaces / Utpal Gangopadhyay / Paul Wynblatt -- Measurement of Plasticity Gradients with Scanning Probe Microscopy / James D. Kiely / Dawn A. Bonnell -- Surface Steps on (100) MgO Foils Imaged by TEM, SEM and AFM / Simon King / Jason Heffelfinger / Michael Mallamaei / Stuart McKernan / C. Barry Carter -- High Sensitivity FT-IR-RAS for Silicon Surface Study / Hisayoshi Ohshima / Tsuneo Urisu / Yoshiyasu Yamada / Tadashi Hattori -- Infrared Spectra of Ultra-Thin SiO[subscript 2] Grown on Si Surfaces / T. Yamazaki / S. Miyazaki / C. H. Bjorkman / M. Fukuda / M. Hirose -- New Analytical Method of SiO[subscript 2] Structure by Infrared Reflection Absorption Spectroscopy (IR-RAS) / K. Ishikawa / H. Ogawa / C. Inomata / S. Fujimura / H. Mori -- The Enabling Role of Surface Passivation in Visible Photoluminescence from Si Nanoparticles / A. A. Seraphin / E. Werwa / L. A. Chiu / K. D. Kolenbrander -- Ionic Conduction Mechanisms in CaF[subscript 2] and [actual symbol not reproducible] Nanocomposite Films on Al[subscript 2]O[subscript 3] Substrates / F. A. Modine / D. Lubben / J. B. Bates -- Enhanced Ionic Conduction at the Film/Substrate Interface in Lil Thin Films Grown on Sapphire(0001) / D. Lubben / F. A. Modine -- The Surface Morphology of Titanium Nitride/Copper Bilayers Annealed at High Temperatures / Antonio C. Berti / Shyam P. Murarka / Laura E. Brooke -- Sputter Etching Effect on Magnetic Properties in TaOx/TbFeCo/Ag Layered Films / Takumi Shimamori / Hidemi Yoshida / Yoshimitsu Kobayashi -- The Influence of Silicon Overlayers on the Electrical Conductivity of Very Thin Chromium Films / Andrej N. Aleshin / Klaus Schroder -- Ultraviolet (UV) Irradiation Effect on Minority-Carrier Recombination Lifetime in Silicon Wafers with Oxide and Nitride Films / L. Zhong / F. Shimura -- The Influence of Grain Boundary Structural Disorder on the Magnetic Properties of Nanocrystalline Nickel / Barbara Szpunar / Uwe Erb / Karl T. Aust / Gino Palumbo / Laurent J. Lewis -- and Contents note continued: Switching and Negative Capacitance in Thin Amorphous SiC-Si Heterojunction Diode / K. Sohn / H. Lee -- Back-Channel Surface Modifications for a-Si:H Thin Film Transistors, TFTs, by Exposure to Plasma Excited N[subscript 2]O / S. S. He / D. J. Stephens / G. Lucovsky -- Photodarkening Effect Dependent on Alkaline Metal Dopants in Semiconductor-Doped Glass / T. Yanagawa / H. Nakano -- Structural and Electrical Properties of BaTiO[subscript 3] Thin Films Grown on p-Si Substrates with Different Device Designs / L. H. Chang / Q. X. Jia / W. A. Anderson -- A New Method for the Simultaneous Analysis of I-V/T and C-V/T Measurements of an Au/p-InP Epitaxial Schottky Diode / P. Cova / A. Singh / R. A. Masut / J. F. Currie -- Effect of Doping on the Interface States in Au Schottky Contact to p-In[subscript 0.21]Ga[subscript 0.79]As Grown on GaAs by Metal Organic Vapour Phase Epitaxy / A. Singh / P. Cova / R. A. Masut -- Optical Characterization of Buried InGaAs/GaAs Wires Overgrown by MBE / K. Pieger / J. Straka / Ch. Greus / A. Forchel -- Computer Simulation of Free-Surfaces in Close-Packed Structures / J. R. Fernandez / A. M. Monti / R. C. Pasianot -- NH[subscript 3]-Plasma Treatment of GaAs Surface at High Temperature in Remote Plasma and Direct Plasma Reactor / Kyoung Wan Park / Seong Jae Lee / Mincheot Shin / El-Hang Lee -- Sulfonated Metal-Oxide Surfaces: What Makes Them So Acidic? / Kim F. Ferris -- Interfacial Reactions of Ti-24Al-11Nb Alloy with Al[subscript 2]O[subscript 3] / Weimin Si / Pengxing Li / Renjie Wu -- Growth Mode of CeO[subscript 2] on Si Surface / Toyohiro Chikyow / Lee Tye / Nadia A. El-Masry / Salah M. Bedair -- Solid-State Reactions of a 3d-Transition Metal-Ti/Al[subscript 2]O[subscript 3] System / Seiichi Suenaga / Miho Koyama / Shinji Arai / Masako Nakahashi -- Interfacial Effects in Polycaproamide-Aramide Polymer Systems / Vladimir P. Dmitrenko -- Electronic Structure of the [Sigma]3[111] Grain Boundary and Doping Effect in Ni / Wang Chongyu / Zhao Dongliang -- Finite-Temperature Molecular Dynamics Study for Atomic Structures of Grain Boundary in Transition Metals Fe and Ni / Wang Chongyu / Duan Wenhui / Song Quanming -- Surface Hardening of Ceramic Oxide and Metal Alloy Single Crystals by Ultrasonic Cavitation / James R. Brewster / Y. Powell-Friend / L. A. Boatner -- Liquid Infiltration of MgO and Al[subscript 2]O[subscript 3] Thin Films / Michael P. Mallamaci / Sundar Ramamurthy / C. Barry Carter -- Effects of Near Interfacial Microstructure on Interlaminar Fracture Toughness of Hybrid Metal-Polymer Composites / Alexander S. Grabilnikov / Oleg M. Zinevich -- Electrodeposited Cobalt-Tungsten as a High-Temperature Diffusion Barrier for Graphite-Fiber/Nickel Composites / N. S. Wheeler / D. S. Lashmore -- Adhesion of Tungsten Fine Lines on SiO[subscript 2] by Micro-Wedge Scratching / M. P. de Boer / H. Huang / J. C. Nelson / F. Wang / W. W. Gerberich -- The Study of Silicon Diffusion into GaAs by Rapid Thermal Oxidation / W. S. Chen / C. Fu -- Near Interface Oxide Degradation in High Temperature Annealed Si/SiO[subscript 2]/Si Structures / R. A. B. Devine / D. Mathiot / W. L. Warren / D. M. Fleetwood -- Characterization of Ti/TiN Films and SiO[subscript 2]/Ti Interfaces by Use of X-Ray Photoelectron Spectroscopy / Joffre Bernard / Ercan Adem / Seshadri Ramaswami.
Subject(s)
ISBN
1558992170
Note
"Papers from Symposium Ca, Interface Control of Electrical, Chemical , and Mechanical Properties, at the Materials Research Society, 1993 Fall Meeting"--Preface p. xv.
AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
Bibliography Note
Includes bibliographical references and index.
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