Structure and properties of multilayered thin films : symposium held April 17-20, 1995, San Francisco, California, U.S.A. / editors, Tai D. Nguyen [and others].
- Published
- Pittsburgh, Pa. : Materials Research Society, [1995]
- Copyright Date
- ©1995
- Physical Description
- xiii, 496 pages : illustrations ; 24 cm.
- Additional Creators
- Nguyen, Tai D.
Online Version
- Series
- Contents
- Machine generated contents note: Materials Research Society Symposium Proceedings -- Crystallization in Metal-Metalloid Multilayers / R. Sinclair / T. J. Konno / T. Itoh / N. C. Zhu -- Diffusion in Metallic Multilayers / A. L. Greer -- Measuring Enthalpies of Formation Using Thick Multilayer Foils and Differential Scanning Calorimetry / T. P. Weihs / T. W. Barbee, Jr. / M. A. Wall -- Solid State Reaction of Al and Zr in Al/Zr Multilayers: A Calorimetry Study / K. J. Blobaum / T. P. Weihs / T. W. Barbee, Jr. / M. A. Wall -- Reactive Phase Formation in Sputter-Deposited Ni/Al Thin Films / K. Barmak / C. Michaelsen / R. Bormann / G. Lucadamo -- TEM Study of Crystallization of a-SiC in Contact with Silver / Nanchang Zhu / Robert Sinclair -- In Situ TEM Study of Reactions in Iron/Amorphous Carbon Layered Thin Films / Toshio Itoh / Robert Sinclair -- Multilayer Precursor Synthesis of New Copper-Tungsten Selenides / Lorell Fister / Marc D. Hornbostel / David C. Johnson -- Reactive Diffusion-Competition of Stable and Metastable Phases / Andrei M. Gusak / Andrei V. Nazarov -- Solid State Reactions in the Zr-Al-Cu-Ni Bulk Metallic Glass Forming Alloy System / Ralf Busch / Eric Bakke / William L. Johnson -- The Preparation of Crystalline NbSe[subscript 2]/TiSe[subscript 2] Superlattices from Modulated Elemental Reactants / Myungkeun Noh / James Thiel / David C. Johnson -- Use of a New High Speed Acrylate Deposition Process to Make Novel Multilayer Structures / David G. Shaw / Marc G. Langlois -- Large-Area Pulsed Laser Deposition (PLD) / R. Dietsch / Th. Holz / H. Mai / M. Panzner / S. Vollmar -- High Quality NiFe/Ag Superlattices Made by Pulsed Laser Deposition (PLD) / Randolph E. Treece / Paul Dorsey / James S. Horwitz / Syed Qadri / Douglas B. Chrisey -- Some Characteristics of X-ray Multilayered Thin Films Made with a Plasma Controlled System / M. Cilia / A. Yakshin / H. Trambly / B. Vidal -- Substrate Effects on the Nucleation and Growth of GaSe Layers by van der Waals Epitaxy / Lee E. Rumaner / J. L. Gray / F. S. Ohuchi / K. Ueno / A. Koma -- The Formation [actual symbol not reproducible] Multilayer Structures by High-Dose Ion Implantation / Laurence A. Gea / L. A. Boatner / Janet Rankin / J. D. Budai -- Aluminum/Copper Nonocomposites Fabricated by the Jet Vapor Deposition Process / Rebecca L. Lankey / L. M. Hsiung / H. N. G. Wadley / S. M. Karecki / D. T. Smith / B. L. Halpern / J. J. Schmitt -- Real-Time Studies of the Electrocrystallization of Nanoscale Ceramic Superlattices / Teresa D. Golden / Richard J. Phillips / Jay A. Switzer -- Epitaxial Growth of Metastable Face-Centered Cubic Co on (111)Si with a Thin Intermediate Cu Layer / C. S. Liu / L. J. Chen -- Analytical Electron- and Atomic Force Microscopy Study of Multilayered Oxide Films Formed on Ce-Doped Ni / F. Czerwinski / J. A. Szpunar / W. W. Smeltzer -- A Multilayer Approach to the Design of Fine Dispersed Metallic Two Component Materials / C. Eisenmenger-Sittner / R. Behr / A. Bergauer / A. Heji / W. Bauer -- Charge Transfer From PbS Quantum Dots to Insulating TiO[subscript 2] Matrix / R. Konenkamp / P. Hoyer -- Structural Characterisation of Fe-Cu Multilayers of Differing Fe Thicknesses Using Transmission Electron Microscopy / S. J. Lloyd / R. E. Somekh / W. M. Stobbs -- Effect of Magnetic CoZrNb Seed Layers on Pd/Co Multilayers / Jonathan C. Morris / Wenhong Liu / Bruce M. Lairson -- Characterization of Electrodeposited Cobalt/Platinum(111) Ultrathin Films and Multilayers / Y. Jyoko / S. Kashiwabara / Y. Hayashi -- Structural and Chemical Characterisation of Ni/Ti Multilayers with TEM / K. Leifer / P. A. Buffat / P. Boni / D. Clemens / H. P. Friedli / H. Grimmer / I. S. Anderson -- An In Situ Electron Microscopy Technique for the Study of Thermally Activated Reactions in Multilayered Materials / M. A. Wall / T. W. Barbee, Jr. / T. P. Weihs -- High-Resolution Transmission Electron Microscopy Study of Metallic Spin-Glass/Amorphous Silicon Multilayers / David A. Howell / Martin A. Crimp / Lilian M. Hoines / J. Bass -- Magnetic Properties and Structural Transformation in Copper-304 Stainless Steel Multilayer Materials / K. Parvin / S. P. Weathersby / T. W. Barbee, Jr. / T. P. Weihs / M. A. Wall -- Structural Studies of Sputtered Ni[subscript 80]Co[subscript 20]/Cu Multilayers / X. Bian / Z. Altounian / J. O. Strom-Olsen / M. Sutton / R. W. Cochrane -- Absolute Calibration of SIMS Depth Profiles of a-SiN[subscript x]:H/a-Si:H and a-SiO[subscript x]:H/a-Si:H Multilayers / Jianwei Li / Jan M. Chabala / Riccardo Levi-Setti -- High Resolution SEM Imaging of Multilayer Thin Films / J. R. Kingsley / I. D. Ward / J. P. Vitarelli -- Imaging Cross Section of X-ray Multilayer Mirror by Scanning Tunneling Microscope / Qi Wang / L. V. Knight / M. J. Thorne -- Superconducting Multilayers: Microstructural Properties Studied by X-ray Diffraction / A. Vallionis / A. Brazdeikis / A. S. Flodstrom -- Structure of Magnetic Multilayers and Magnetoresistance / Teruya Shinjo -- The Magneto-Optical Quantum Size Effect in bcc-Fe(001) and (110) Ultrathin Films / Y. Suzuki / T. Katayama / W. Geerts / P. Bruno / H. Sawada -- Hyperfine Field and Electronic Structure in Fe/Co and Fe/Ni Multilayer Systems / Manabu Takahashi / Xiao Hu / Yoshiyuki Kawazoe -- Magnetic Phase Transition in the CsCl FeSi Spacer in Fe/FeSi Multilayers / J. Dekoster / A. Vantomme / S. Degroote / R. Moons / G. Langouche -- Fabrication and Structural and Optical Properties of Amorphous Si/SiO[subscript 2] Superlattices on (100) Si / J.-M. Baribeau / D. J. Lockwood / Z.-H. Lu -- Characterization of Asymmetric Polydiacetylene Ultrathin Films / D. W. Cheong / V. Shivshankar / H. C. Wang / C. M. Sung / J. Kumar / S. K. Tripathy -- Structure and Novel Electrical Effects in a-Si:H Based Multilayers Containing Discontinuous Metal Sublayers / A. N. Panckow / T. P. Drusedau / F. Klabunde / B. Schroder -- In-Situ Observation of Stress in Cu/Pd Multilayers / T. Ueda / G. F. Simenson / W. D. Nix / Bruce M. Clemens -- In Situ Stress Measurements of Co-Based Multilayer Films / Young-Suk Kim / Sung-Chul Shin -- A Model of Superlattice Yield Stress and Hardness Enhancements / Xi Chu / Scott A. Barnett -- Stress, Microstructure, and Thermal Behavior in Mo/Si X-ray Multilayers / Tai D. Nguyen / James H. Underwood -- Elastic Properties of Pure and Hydrogenated Ce/Fe Multilayer Films / R. Hassdorf / M. Arend / W. Felsch -- Residual Stress, Mechanical Behavior and Electrical Properties of Cu/Nb Thin-Film Multilayers / A. J. Griffin, Jr. / J. D. Embury / M. F. Hundley / T. R. Jervis / H. H. Kung / W. K. Scarborough / K. C. Walter / J. Wood / M. Nastasi -- Enhanced Hardness and Stress-Driven Delamination in Fe/Pt Multilayers / B. J. Daniels / W. D. Nix / B. M. Clemens -- An In Situ High Voltage Electron Microscopy Technique for the Study of Deformation and Fracture: In Multilayered Materials / M. A. Wall / T. W. Barbee, Jr. / T. P. Weihs -- Beryllium-Based Multilayer Structures / D. G. Stearns / K. M. Skulina / M. Wall / C. S. Alford / R. M. Bionta / D. M. Makowiecki / E. M. Gullikson / R. Soufli / J. B. Kortright / J. H. Underwood -- Specular and Off-Specular X-ray Scattering as Quantitative Structural Probes of Multilayers. Application to Mn/Ir(111) Superlattices / H. M. Fischer / H. E. Fischer / M. Bessiere / J.-F. Bobo / O. Lenoble / S. Andrieu / M. Piecuch -- X-ray Optical Properties of C/C-Multilayers Prepared by Pulsed Laser Deposition (PLD) / R. Dietsch / T. Holz / H. Mai / S. Hopfe / R. Scholz / B. Wehner / H. Wendrock -- Pulsed Laser Deposition of Laterally Graded X-ray Optical Multilayers on Substrates of Technical Relevance / R. Dietsch / Th. Holz / R. Krawietz / H. Mai / B. Schoneich / R. Scholz / S. Vollmar / B. Wehner -- Interfacial Reactions and Thermal Stability of Ultrahigh Vacuum Deposited Multilayered Mo/Si Structures / J. M. Liang / L. J. Chen -- Metal/Al[subscript 2]O[subscript 3] Multilayers as High-Temperature X-ray Mirrors / Ch. Morawe / H. Zabel -- Role of Crystallinity in Roughness of Ru/C Multilayers - An Amorphization Study / C. C. Walton / J. B. Kortright -- Production of Mo/Si Multilayers at Increased Substrate Temperatures: The Effect on D-Spacing, Interface Roughness and Density / H.-J. Voorma / E. Louis / N. B. Koster / F. Bijkerk / M. J. van der Wiel -- Interference Effects in X-ray Specular Reflectivity from Thin Films / S. Lagomarsino / S. Di Fonzo / W. Jark / B. Muller / A. Cedola / G. Pelka -- Thermal Degradation of Tantalum-Nickel Thin Film Couples / M. H. Tabacniks / A. J. Kellock / J. E. E. Baglin / K. R. Coffey / J. K. Howard / M. A. Parker -- AFM, XPS and XRD Studies of W Films Growth by LPCVD onto TiN Substrates / S. Santucci / L. Lozzi / M. Passacantando / P. Picozzi / L. Orifoni / R. Diamanti / O. Moccia / R. Alfonsetti -- Characterization of the Nucleation and Growth Process of CVD-W on TiN Substrates / Arun K. Nanda / Sailesh M. Merchant / Pradip K. Roy -- Segregation of Si and Cu at AlSiCu/TiN Interfaces / A. Kameyama / A. Yaoita / T. Kitano / S. Saito -- XPS, AES and LEED Studies of the Interaction Between the Si(100)2x1 Surface and Cadmium Deposited at Room Temperature / S. Santucci / S. Di Nardo / L. Lozzi / M. Passacantando / P. Picozzi -- Evolution of Co/Ge Films on Si(100) and Ge(100) Substrates / G. R. Carlow / T. D. Lowes / M. Grunwell / M. Zinke-Allmang -- Electrical Properties of (Zn,Mn) Containing Multilayer Metallizations to p-Type InGaAs/InP / Patrick W. Leech / Geoffrey K. Reeves / Wei Zhou -- The Effects of Thermal Processing on Interfacial Microstructure for Thin Multilayered Metal Ohmic Contacts to p[superscript +]-AlGaAs / M. W. Cole / W. Y. Han / K. A. Jones -- Compositional Characterization of Very Thin [actual symbol not reproducible] Stacked Films by XPS Using the "Auger Parameter Method" / S. Santucci / L. Lozzi / M. Passacantando / P. Picozzi / R. Alfonsetti / F. Fama / G. Moccia -- and Contents note continued: An Electrical Model for Multilayered n[superscript +]/n and Heterostructure Planar Ohmic Contacts / Geoffrey K. Reeves / Patrick W. Leech / H. Barry Harrison -- Microstructural Characterization of Al-.5Cu and Al-1Si on 0.6nm TCA-SiO[subscript 2]/Si Following Heat Treatment at 400[degree]C in N[subscript 2]-Mechanisms Providing Stability and a High Break Down Voltage for the Al-.5Cu MOS Device / Jack M. McCarthy -- Structural and Electrical Properties of Thin Metal Films Deposited at Low Temperature / L. He / E. Li / E. Morrison / D. Sirur / Z. Q. Shi -- Nanocrystalline Solutions as Precursors to the Spray Deposition of CdTe Thin Films / Martin Pehnt / Douglas L. Schulz / Calvin J. Curtis / Helio R. Moutinho / Amy Swartzlander / David S. Ginley -- Capacitance Humidity Sensor / Andrew R. K. Ralston / Paul E. Thoma / Carl F. Klein / Denice D. Denton -- Characterization of Multilayer Thin Film Structures for Gas Sensor Applications / M. Dibattista / S. V. Patel / K. D. Wise / J. L. Gland / J. F. Mansfield / J. W. Schwank -- The Influence of a-Si:H/Substrate Interface on Electronic Properties of Me-a-Si:H - Substrate Structures / B. G. Budaguan / A. A. Aivazov / M. N. Meytin.
- Subject(s)
- ISBN
- 1558992855
- Note
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note
- Includes bibliographical references and indexes.
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