Structure and evolution of surfaces : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. / editors, Robert C. Cammarata [and others].
- Published
- Pittsburgh, Pa. : Materials Research Society, [1997]
- Copyright Date
- ©1997
- Physical Description
- xiii, 509 pages : illustrations ; 24 cm.
- Additional Creators
- Cammarata, R. C. (Robert C.)
Online Version
- Series
- Contents
- Machine generated contents note: Faceting of Stepped Silicon (113) Surfaces: Step Unbinding, Dynamic Scaling, and Nanoscale Grooves / S. G. J. Mochrie / S. Song / Mirang Yoon -- Surface and Interface Stress in Epitaxial Growth / H. Ibach / A. Grossmann -- Step Contours in the Development of Periodically Modulated Vicinal Surfaces / S. Tanaka / C. C. Umbach / J. M. Blakely -- The Formation and Evolution of InAs 3D Islands on GaAs(001) and a Comparative C-AFM and NC-AFM Study of InAs 3D Islands / T. R. Ramachandran / N. P. Kobayashi / R. Heitz -- Atomistic Structure of High Index Surfaces / Batsirai Mutasa / Diana Farkas -- Surface Structure Determination of C(2 x 2) N[subscript 2]/Ni(100) and Low and Intermediate Coverages of CO/Cu(111) by Angle-Resolved Photoemission Fine Structure (ARPEFS) Using Synchrotron Radiation / E. J. Moler / W. R. A. Huff / S. A. Kellar -- Characterization of Silicon Surfaces After Low-Temperature H[subscript 2] Annealing Prior to Low-Temperature Atmospheric Pressure Epitaxial Silicon Growth / Hugo Bender / Marie-Jose Mouche / Matty Caymax -- Surface Relaxation Mechanisms in the Morphological Equilibration of Crystal Surfaces / Jonah D. Erlebacher / Michael J. Aziz -- HRLEED Study of the Roughening Transitions in Cu(110), Ni(110), and Ag(110) Surfaces / Kemei Wang / Pedro A. Montano -- Roughening and Preroughening of Diamond-Cubic {111} Surfaces / Donald L. Woodraska / John A. Jaszczak -- Development of Si(100) Surface Roughness at the Initial Stage of the Etching in F[subscript 2] and XeF[subscript 2] Gases - Ellipsometric Study / V. S. Aliev / V. N. Kruchinin -- AFM Methodology for the Measurement of Silicon Wafer Microroughness / A. G. Gilicinski / S. E. Beck / R. M. Rynders -- Vacancy Diffusion Kinetics on Si(111) and (001) Surfaces Studied by Scanning Reflection Electron Microscopy / Heiji Watanabe / Masakazu Ichikawa -- A New Single-Crystal Adsorption Calorimeter for Determining Metal Adsorption and Adhesion Energies / J. T. Stuckless / D. Starr / D. Bald -- Atomic Sites of Isolated [superscript 111]In Atoms After Low Energy Deposition on Stepped Cu(100) Surfaces / C. R. Laurens / M. F. Rosu / F. Pleiter -- Simulation of Surface Diffusion Using Embedded Atom Potentials in FCC Metals / Jun-ichiro Takano / Masao Doyama / Yoshiaki Kogure -- Fluorescence Imaging of the Aluminum Oxide Transformation on the Surface of Single-Crystal (111)NiAl / H. E. Schaffer / D. M. Lipkin / F. Adar -- Nucleation on Defects in Heteroepitaxy / J. A. Venables -- Effects of Hydrogen on Nucleation of Islands During Si(001) MBE Growth / Kazuki Mizushima / Pavel Smilauer / Dimitri D. Vvedensky -- The As-Grown Microtopologies of Modified-Lely SiC(0001) Terraced Vicinal Surfaces / T. Marek / J. Heindl / H. P. Strunk -- Growth of Niobium Films at High Temperatures on Sapphire / T. Wagner -- Evolution of Surface Roughness During CVD Growth / E. Chason / T. M. Mayer / D. P. Adams -- Improvement of the Nucleation and Growth of Thin-Film Phosphors for Electroluminescent Flat-Panel Displays / T. S. Moss / B. F. Espinoza / R. C. Dye -- Growth Transients During the Nucleation of GaInAs on InP by Organometallic Vapor-Phase Epitaxy / D. T. Emerson / J. R. Shealy -- The Effect of Stress on the Nanomechanical Properties of Au Surfaces / J. E. Houston -- Micromechanical Deformation of Single-Crystal Alumina Surfaces / Andrey V. Zagrebelny / John C. Nelson / C. Barry Carter -- Relating Polymer Indentation Behavior to Elastic Modulus Using Atomic-Force Microscopy / M. R. Vanlandingham / S. H. McKnight / G. R. Palmese -- Deformation of Polymer Films by Bending Forces / D. W. Heermann / A. Linke / G. Patzold -- Nonlinear Optical Microscopy for Imaging Patterned Self-Assembled Monolayers / L. Smilowitz / Q. X. Jia / X. Yang -- The Structure of Antigen-Antibody Layers Adsorbed on Silica Surfaces: A Scanning Angle Reflectometry Study / E. K. Mann / L. Heinrich / J. C. Voegel -- Structural and Morphological Characterization of Ultrathin Films of an Asymmetric Polydiacetylene / H. C. Wang / D. W. Cheong / J. Kumar -- Mound Formation and Coarsening in Homoepitaxial Growth / Jacques G. Amar / Fereydoon Family -- The Role of Roughness in Texture Development / J. F. Whitacre / J. C. Bilello / S. M. Yalisove -- Exact Scaling Form for the Island-Size Distribution in Submonolayer Epitaxial Growth / M. C. Bartelt / J. W. Evans -- Scaling Properties of Submonolayer Growth Including Evaporation and Defects / H. Larralde / P. Jensen / M. Meunier -- A Study of Step Coverage Morphologies of SiH[subscript 4]-WSi[subscript x] and [actual symbol not reproducible] for ULSl Technologies / Cengiz S. Ozkan / Mansour Moi npour / Jian Li -- Initial Growth and Interface Structure of CdTe Thin Films Grown by MBE on 4* Miscut Si Substrates / S-C. Y. Tsen / David J. Smith / S. Rujirawat -- Characterization of Various Organic Coatings on Glasses / Donghun Lee / Robert A. Condrate Sr -- Surface Morphology of [actual symbol not reproducible] Epitaxial Films Deposited by Low-Temperature UHV-CVD / S. John / E. J. Quinones / B. Ferguson -- Processing Temperature Dependence on Surface Morphology and Microstructure of Gold Films / L. He / J. Siewenie / Z. Q. Shi -- Surface Morphology of InGaP in the Al-Free Pump LD / Ahn Goo Choo / Seong Heon Kim / Nam Heon Kim -- Studies of Interface and Surface Structures of BaTiO[subscript 3] Thin Films Grown on SrTiO[subscript 3](001) substrates by MBE / Hisashi Shigetani / Kazuyoshi Kobayashi / Masayuki Fujimoto -- Structural and Electrical Properties of Ni/Co Superlattices Using Pb as a Surfactant / M. Iwanami / R. Furukawa / T. Matsumoto -- Atomistic Study of Surface Polarization in Superconducting Perovskites / David Fuks / Simon Dorfman / Eugene Heifets -- Skewed Height Distributions of Kinetically Roughened Films / P. Kleban / J. Krim / C. Ruffing -- Low-Temperature Annealing of Rh(111) Surfaces / Frank Tsui / Joanne Wellman / Junhao Xu -- Studies of Morphological Instability and Dislocation Formation in Heteroepitaxial Si[subscript 1-x]Ge[subscript x] Thin Films Via Controlled Annealing Experiments / Cengiz S. Ozkan / William D. Nix / Huajian Gao -- Surface Morphology of Nb Films by Ion-Beam-Assisted Deposition / Hong Ji / Gary S. Was / J. Wayne Jones -- The Morphological Stability of Strained Epitaxial Layers / B. W. Wessels -- Roughness Characterization by Optical Spectroscopy of CoSi[subscript 2] Thin Films / S. Bocelli / G. Guizzetti / F. Marabelli -- Microelectronic Film Thickness Determination Using a Laser-Based Ultrasonic Technique / R. Logan / A. A. Maznev / K. A. Nelson -- Structure of KCN Monolayer Films Vapor-Deposited Onto Cleaved KBr(001) by Helium Atom Diffraction / S. A. Safron / J. R. Baker / J. A. Li -- Evolution of Interfacial Roughness Correlations of Fe Au Films Grown on MgO(001) Substrates / P. C. Chow / R. Paniago / R. Forrest -- Influence of Chemical Composition on the Epitaxy and Interfacial Quality of Fe/Au and Fe/Ag Multilayers / R. Paniago / P. C. Chow / R. Forrest -- The Effect of Si Additions on the Epitaxial Growth of Ge[subscript 1-x]C[subscript x] Alloys on Si(100) / Bi-Ke Yang / J. D. Weil / M. Krishnamurthy -- Nucleation and Pattern Formation of Coherent Islands During Epitaxial Growth of Ge on Si(110) Surfaces / J. D. Weil / Bi-Ke Yang / C. G. Slough -- Growth and Epitaxy of Au on TiO[subscript 2](110) / F. Cosandey / R. Persaud / L. Zhang -- Surface Roughening During Titanium Silicide Formation: A Comparison Between Si(100) and Poly-Si Substrates / C. Lavoie / R. Martel / C. Cabral -- Kinetic Model for Layer-By-Layer Homoepitaxial Growth / V. I. Trofimov / V. G. Mokerov / A. G. Shumyankov -- Autocorrelation Function and Roughness Spectrum of a Growing Film Surface / V. I. Trofimov -- Surface Structure and Morphology of [actual symbol not reproducible] (SBT) Thin Films / Tingkai Li / Pete Zawadzki / Richard A. Stall -- A 3-D Kinetic Monte Carlo Study of the Growth of Si Thin Films Using Beams With Varying Angle of Incidence / S. W. Levine / J. R. Engstrom / P. Clancy -- Surface Roughness Characterization of Au Thin Films by Spectroscopic Ellipsometry, Grazing X-ray Reflectance, Light Scattering and Scanning Tunneling Microscopy / P. Boher / J. L. Stehle -- Metal Oxide Surface Modifications With Other Metal Oxides and Carbides / Richard Stephenson / Richard Partch -- Epitaxial Cobalt Silicide Formation Using High-Temperature Sputtering and Vacuum Annealing / K. Inoue / R. T. Tung / K. Mikagi -- The Chemistry of Chemical Vapor Cleaning of Fe With the Chelating Ligand 1,1,1,5,5,5-Hexafluoro-2,4-Pentanedione (H[superscript +]hfac) / M. A. George / S. E. Beck / D. A. Moniot -- High-Rate ECR Plasma Etching of Cu at Room Temperature in Cl[subscript 2]/Ar / K-B. Jung / J. W. Lee / Y. D. Park -- Surface Morphology Modification of Indium Induced by Nanosecond Pulsed uv Laser Irradiation: Influence of Ambient Pressure / A. Demchuk -- Ion-Sputter-Induced Rippling of Si(111) / Jonah D. Erlebacher / Michael J. Aziz -- Co Segregation at the Surface of a Pb-Bi-Ni Alloy / A. I. Landa / A. V. Ruban / I. A. Abrikosov -- HRLEED and STM Study of Misoriented Si(100) With and Without a Te Overlayer / Salima Yala / Pedro A. Montano -- Microstructural Studies of Co Silicide Layers Formed on SiGe and SiGeC / S. Jin / H. Bender / R. A. Donaton -- Thin Films of CoSi[subscript 2] Co Deposited Onto Si[subscript 1-x]Ge[subscript x] Alloys / Peter T. Goeller / Boyan I. Boyanov / Dale E. Sayers -- Segregation of Copper to (100) and (111) Silicon Surfaces in Equilibrium With Internal Cu[subscript 3]Si Precipitates / W. R. Wampler -- Surface and Interface Analysis of Thin-Film/Si(Substrate) Contacts by SXES / C. Heck / M. Kusaka / M. Hirai.
- Subject(s)
- ISBN
- 1558993444
- Note
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note
- Includes bibliographical references and indexes.
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