Actions for Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. / editors, George Y. Baaklini [and others].
- Published
- Warrendale, Pa. : Materials Research Society, [2000]
- Copyright Date
- ©2000
- Physical Description
- xiii, 322 pages : illustrations ; 24 cm.
- Additional Creators
- Baaklini, George Y.
Online Version
- Series
- Contents
- Machine generated contents note: Materials Research Society Symposium Proceedings -- Optimization of X-ray Techniques for Nondestructive Characterization of Single Crystal Turbine Blades / K. G. Lipetzky / R. E. Green, Jr. / J. M. Winter, Jr. -- In Situ Observation of Oxidization Process at the Most Upper Surfaces by X-ray Surface Propagation Waves / Kenji Ishida / Toshihisa Horiuchi / Kazumi Matsushige -- Three-Dimensional, Nondestructive Imaging of Low Density Materials / D. L. Haupt / J. D. Lemay / J. H. Kinney -- Image-Guided Failure Assessment of Porous Materials / R. Muller / M. Tantillo -- X-ray Microtomography of Fatigue Crack Closure as a Function of Applied Load In Al-Li 2090 T8E41 Samples / R. Morano / S. R. Stock / G. R. Davis / [et al.] -- Interfacial Diffusion in a MOCVD Grown Barium Titanate Film / [et al.] / A. G. Richter / A. Datta / Sorna Chattopadhyay -- High-Frequency Stroboscopic X-ray Topography Under Surface Acoustic Wave Excitation / E. Zolotoyabko -- Scanning Acoustic Microscopy and X-ray Diffraction Investigation of Near Crack Tip Stresses / R. W. Martin / S. Sathish -- Development of Nondestructive Method for Prediction of Crack Instability / D. Eylon / J. L. Schroeder / E. B. Shell / [et al.] -- Nondestructive Characterization of Corrosion Protective Coatings on Aluminum Alloy Substrates / [et al.] / M. Khobaib / S. Sathish / J. Hoffmann -- Nondestructive Evaluation of Fatigue in Titanium Alloys / [et al.] / S. Sathish / N. Meyendorf / H. Rosner -- Real-Time Monitoring of Acoustic Linear and Nonlinear Behavior of Titanium Alloys During Cyclic Loading / S. Sathish / [et al.] / J. Frouin / J. Maurer -- Impedance Spectroscopy Investigation on the Low-Temperature Degradation of Tetragonal Zirconia: Influence of Measurement Conditions / A. P. Santos / R. Z. Domingues -- Electrically Based Non-Destructive Microstructural Characterization of All Classes of Materials / Rosario A. Gerhardt -- Non-Destructive Dielectric Assessment of Water Permeation in Composite Structures / P. Boinard / E. Boinard / R. A. Pethrick / [et al.] -- Nondestructive Damage Evaluation of Electro-Mechanical Components Using a Hybrid, Computational and Experimental Approach / C. Furlong / R. J. Pryputniewicz -- The Role of Structure-to-Property-Relationships in Materials Characterization / W. Morgner -- Nonlinear Ultrasonic Parameter in Precipitate-Hardened Steels / D. C. Hurley / D. Balzar / P. T. Purtscher -- Infrared Evaluation of Heat Generation During the Cyclic Deformation of a Cellular Al Alloy / A. Rabiei / J. W. Hutchinson / A. G. Evans -- Microscopic Techniques for Characterization of Magnetic Layers / N. Meyendorf / I. Altpeter / U. Netzelmann / [et al.] -- Giant Magnetoresistance Imaging for NDE of Conductive Materials / E. S. Boltz / S. G. Albanna / A. R. Stallings / [et al.] -- Non-Destructive Evaluation of Mechanical Properties of Magnetic Materials / Kevin P. Kankolenski / Susan Z. Hua / David X. Yang / [et al.] -- Non-Destructive Evaluation of 304 Stainless Steels Using a Scanning Hall-Sensor Microscope: Visualization of Strain-Induced Austenite-Phase Breakdown / A. Oota / K. Miyake / D. Sugiyama / [et al.] -- Dual Band Infrared Thermography as a NDT Tool for the Characterization of the Building Materials and Conservation Performance in Historic Structures / A. Moropoulou / N. P. Avdelidis / M. Koul / [et al.] -- Characterization of Hydrogen in Concrete by Cold Neutron Prompt Gamma-Ray Activation Analysis and Neutron Incoherent Scattering / Rick L. Paul / H. Heather Chen-Mayer / Richard M. Lindstrom / [et al.] -- Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy / W. Arnold / S. Amelio / S. Hirsekorn / [et al.] -- Precise Determination of Thin Metal Film Thickness With Laser-Induced Acoustic Grating Technique / A. A. Maznev / M. J. Banet / M. Gostein / [et al.] -- Quantitative Measurement of Local Carrier Concentration of Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Tip / Yutaka Majima / Yutaka Oyama / Mitsumasa Iwamoto -- Characterization of Nitrided Silicon-Silicon Dioxide Interfaces / M. L. Polignano / M. Alessandri / D. Brazzelli / [et al.] -- IR Tomography of the Lifetime and Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots / V. D. Akhmetov / N. V. Fateev -- Monitoring Silicon Quality From Diffusion Furnaces Using In-Line Measurements / Matt Stoker / Kelvin Catmull / Greg Horner / [et al.] -- Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation In the Depletion Layer / D. Marinskiy / J. Lagowski / M. Wilson / [et al.] -- Method and Instrumentation for Nondestructive Characterization of Surface Area and Pore Size Distribution of Thin Films in Their Deposited State / E. S. Boltz / Y. H. Spooner / S. G. Albanna / [et al.] -- Experimental Simulation of Contamination Arising From Electro Rocket Engine-Jet on Surface of Spacecraft Units / A. Chirov / A. Nadiradze / V. Shaposhnikov / [et al.] -- Thermal Penetration Times as a Nondestructive Measure of Orientation in Polyimide Film / C. Chandler / N. E. Mathis / R. J. Samuels -- Photoelastic Imaging of Process Induced Defects in 300mm-Silicon Wafers / N. D. Geiler / W. Kurner / O. Storbeck -- IRS and ESR Characterizations of Nanocomposite Thin Films Derived From Alkanethiolates and Gold Nanoparticles / W. X. Zheng / F. L. Leibowitz / M. M. Maye / [et al.] -- In Situ Spectroscopic Ellipsometry for the Real Time Process Control of Plasma Etching of Silicon Nitride / I. G. Rosen / T. Parent / B. Fidan / [et al.] -- Characterization of Ni- and No(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy / P. S. Lee / D. Mangelinck / K. L. Pey / [et al.] -- Raman Characterization of Composition and Strain in Si[subscript 1-x]Ge[subscript x]/Si Heterostructures / Ran Liu / B. Tillack / P. Zaumseil -- Nondestructive Measurement of In-Plane Residual Stress in Silicon Strips / Tieyu Zheng / Steven Danyluk -- Characterization of Copper Surfaces Used in Electronic Circuit Boards by Reflectance FT-IR / James M. Sloan / Charles G. Pergantis -- In Situ Spectroscopic Ellipsometry Study of the Oxide Etching and Surface Damaging Processes on Silicon Under Hydrogen Plasma / I. M. Vargas / J. Y. Manso / J. R. Guzman / [et al.] -- In Situ Monitoring of MOCVD of Aluminum Nitride by Optical Spectroscopies / S. C. Allen / H. H. Richardson -- Real-Time Optical Characterization and Control of Heteroepitaxial Ga[subscript x]In[subscript 1-x]P Growth by P-Polarized Reflectance / N. Dietz / K. Ito / I. Lauko / [et al.] -- Nondestructive Characterization of GaN Films Grown at Low and High Temperatures / C. H. Yan / H. W. Yao / J. M. Van Hove / [et al.].
- Subject(s)
- ISBN
- 1558994998
- Note
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note
- Includes bibliographical references and indexes.
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