The use of laser diodes for control of uranium vaporization rates [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1993.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 5 pages : digital, PDF file
- Additional Creators:
- Lawrence Livermore National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Within the Atomic Vapor Laser Isotope Separation (AVLIS) program we have successfully used the laser absorption spectroscopy technique (LAS) to diagnose process physics performance and control vaporization rate. In the LAS technique, a narrow line-width laser is tuned to an absorption line of the species to be measured. The laser light that is propagated through the sample is and, from this data, the density of the species can be calculated. These laser systems have exclusively consisted of expensive, cumbersome, and difficult to maintain argon-ion-pumped ring dye lasers. While the wavelength flexibility of dye lasers is very useful in a laboratory environment, these laser systems are not well suited for the industrial process control system under development for an AVLIS plant. Diode-lasers offer lower system costs, reduced man power requirements, reduced space requirements, higher system availability, and improved operator safety. We report the. successful deployment and test of a prototype laser diode based uranium vapor rate control system. Diode-laser generated LAS data was used to control the uranium vaporization rate in a hands-off mode for greater than 50 hours. With one minor adjustment the system successfully controlled the vaporization rate for greater than 147 hours. We report excellent agreement with ring dye laser diagnostics and uranium weigh-back measurements.
- Report Numbers:
- E 1.99:ucrl-jc--112987
E 1.99: conf-9309199--7
- Other Subject(s):
- Published through SciTech Connect.
Society of Photo-Optical Instrumentation Engineer`s (SPIE) international symposium on optical tools for manufacturing and advanced automation,Boston, MA (United States),7-10 Sep 1993.
Hagans, K.; Galkowski, J.
- Funding Information:
View MARC record | catkey: 14665105