Using a straightness reference in obtaining more accurate surface profiles from a Long Trace Profiler [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1991.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- Pages: (6 pages) : digital, PDF file
- Additional Creators:
- Lawrence Berkeley National Laboratory
United States. Department of Energy
United States. Department of Energy. Office of Scientific and Technical Information
- The Long Trace Profiler has found significant applications in measuring the surfaces of synchrotron optics. However, requirements of small slope errors at all spatial wavelengths of the synchrotron optics mandate more accurate slope measurements. A straightness reference for the Long Trace Profiler greatly increases the accuracy of the instrument. Methods of using the straightness reference by interpreting the sequential interference patterns are discussed and results of measurements are presented.
- Published through SciTech Connect.
4. international conference on synchrotron radiation instrumentation, Chester (United Kingdom), 15-19 Jul 1991.
McKinney, W.R.; Takacs, P.Z. . Instrumentation Div.; Lunt, D.L.J.; Irick, S.C.
- Funding Information:
View MARC record | catkey: 14674812