Biomedical elemental analysis and imaging using synchrotron x-ray microscopy [electronic resource].
- Washington, D.C : United States. Dept. of Energy. Office of Energy Research, 1990.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- Pages: (11 pages) : digital, PDF file
- Additional Creators:
- Brookhaven National Laboratory, United States. Department of Energy. Office of Energy Research, United States. Department of Health and Human Services, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- The application of synchrotron x-ray microscopy to biomedical research is currently in progress at the Brookhaven National Synchrotron Light Source (NSLS). The current status of the x-ray microscope (XRM) is reviewed from a technical standpoint. Some of the items considered are photon flux, spatial resolution, quantitation, minimum detection limits, and beam-induced specimen damage. Images can be produced by measurement of fluorescent x rays or of the attenuation of the incident beam by the specimen. Maps of the elemental distributions or linear attenuation of the incident beam by the specimen. Maps of the elemental distributions or linear attenuation coefficients can be made by scanning the specimen past the beam. Computed microtomography (CMT) can be used for non- destructive images through the specimen in either the emission or absorption mode. Examples of measurements made with the XRM are given.
- Report Numbers:
- E 1.99:bnl-44480
E 1.99: conf-900877--8
- Other Subject(s):
- X Radiation
- X-Ray Fluorescence Analysis
- Image Processing
- Biomedical Radiography
- Computerized Tomography
- Synchrotron Radiation Sources
- Chemical Analysis
- Cyclic Accelerators
- Diagnostic Techniques
- Electromagnetic Radiation
- Ionizing Radiations
- Nondestructive Analysis
- Nuclear Medicine
- Radiation Sources
- X-Ray Emission Analysis
- Published through SciTech Connect.
12. international congress for electron microscopy, Seattle, WA (USA), 12-18 Aug 1990.
Jones, K.W.; Spanne, P.; Gordon, B.M.; Schidlovsky, G.; Bockman, R.S.; Saubermann, A.J. . Health Science Center; Dejun, Xue.
- Funding Information:
View MARC record | catkey: 14675078