Actions for Turn-by-Turn and Bunch-by-Bunch Transverse Profiles of a Single Bunch in a Full Ring [electronic resource].
Turn-by-Turn and Bunch-by-Bunch Transverse Profiles of a Single Bunch in a Full Ring [electronic resource].
- Published
- Washington, D.C. : United States. Dept. of Energy, 2005.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- 18 pages : digital, PDF file
- Additional Creators
- Stanford Linear Accelerator Center, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- The apparatus described in this paper can image the evolution of the transverse profile of a single bunch, isolated from a full PEP-II ring of 1500 bunches. Using this apparatus there are two methods of single bunch imaging; bunch-by-bunch beam profiling can image every bunch in the ring a single bunch at a time with the images of sequential bunches being in order, allowing one to see variations in beam size along a train. Turn-by-turn beam profiling images a single bunch on each successive turn it makes around the ring. This method will be useful in determining the effect that an injected bunch has on a stable bunch as the oscillations of the injected bunch damp out. Turn-by-turn imaging of the synchrotron light uses a system of lenses and mirrors to image many turns of both the major and minor axis of a single bunch across the photocathode of a gateable camera. The bunch-by-bunch method is simpler: because of a focusing mirror used in porting the light from the ring, the synchrotron light from the orbiting electrons becomes an image at a certain distance from the mirror; and since the camera does not use a lens, the photocathode is set exactly at this image distance. Bunch-by-bunch profiling has shown that in the Low Energy Ring (LER) horizontal bunch size decreases along a train. Turn-by-turn profiling has been able to image 100 turns of a single bunch on one exposure of the camera. The turn-by-turn setup has also been able to image 50 turns of the minor axis showing part of the damping process of an oscillating injected charge during a LER fill. The goal is to image the damping of oscillations of injected charge for 100 turns of both the major and minor axis throughout the damping process during trickle injection. With some changes to the apparatus this goal is within reach and will make turn-by-turn imaging a very useful tool in beam diagnostics.
- Report Numbers
- E 1.99:slac-tn-05-068
slac-tn-05-068 - Subject(s)
- Other Subject(s)
- Note
- Published through SciTech Connect.
12/15/2005.
"slac-tn-05-068"
Fisher, A.S.; Kraus, R. - Funding Information
- AC02-76SF00515
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