Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities [electronic resource].

Published:: Washington, D.C. : United States. Dept. of Energy. Office of Energy Research, 2005.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Additional Creators:: Thomas Jefferson National Accelerator Facility (U.S.), United States. Department of Energy. Office of Energy Research, and United States. Department of Energy. Office of Scientific and Technical Information

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Summary:

Secondary Ion Mass Spectrometry (SIMS) can characterize the surface and near surface of Nb used in accelerator cavities. Results show Nb oxide in the 2-3 nm range, a depleted H concentration in the oxide compared with the bulk, and N, C, O lower in an annealed single crystal sample than several polycrystalline samples. Other metallic contaminants are primarily at the surface, but tantalum is distributed uniformly through the material.

Report Numbers:

E 1.99:jlab-acc-05-445
E 1.99: doe/er/40150-3631
doe/er/40150-3631
jlab-acc-05-445

Subject(s):

Particle Accelerators

Other Subject(s):

Note:

Published through SciTech Connect.
07/10/2005.
"jlab-acc-05-445"
" doe/er/40150-3631"
12th SRF Workshop, Cornell University, July 10, 2005.
G. R. Myneni; P. Kneisel; Z. Zhu; F. A. Stevie; D. P. Griffis.

Funding Information:

AC05-84ER40150

View MARC record | catkey: 14681996