Contaminant Analysis of Polycrystalline and Single Crystal Niobium Used in Accelerator Cavities [electronic resource].
- Washington, D.C. : United States. Dept. of Energy. Office of Energy Research, 2005.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Additional Creators:
- Thomas Jefferson National Accelerator Facility (U.S.), United States. Department of Energy. Office of Energy Research, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Secondary Ion Mass Spectrometry (SIMS) can characterize the surface and near surface of Nb used in accelerator cavities. Results show Nb oxide in the 2-3 nm range, a depleted H concentration in the oxide compared with the bulk, and N, C, O lower in an annealed single crystal sample than several polycrystalline samples. Other metallic contaminants are primarily at the surface, but tantalum is distributed uniformly through the material.
- Report Numbers:
- E 1.99:jlab-acc-05-445
E 1.99: doe/er/40150-3631
- Other Subject(s):
- Published through SciTech Connect.
12th SRF Workshop, Cornell University, July 10, 2005.
G. R. Myneni; P. Kneisel; Z. Zhu; F. A. Stevie; D. P. Griffis.
- Funding Information:
View MARC record | catkey: 14681996