Frequency Resolved Measurement of Longitudinal Impedances Using Transient Beam Diagnostics [electronic resource].
- Washington, D.C. : United States. Dept. of Energy. Office of Energy Research, 2001. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- vp : digital, PDF file
- Additional Creators:
- Stanford Linear Accelerator Center, United States. Department of Energy. Office of Energy Research, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- In this paper we present several techniques for characterizing longitudinal impedances based on transient measurements of the growth rates and tune shifts of unstable coupled-bunch modes. These techniques are applicable to measurement of both fundamental and higher-order mode impedances and allow characterization of shunt impedances and quality factors of the HOMs. Methods presented here are complementary to lab bench measurements of RF cavities, in that the beam based measurements directly sense the physical impedance in the installed configuration. In contrast to a single-bunch integrated impedance measurement these techniques resolve the impedances in the frequency domain. These methods allow determination of the impedance's unaliased frequency by analyzing synchronous phase transients. Experimental results from ALS and BESSY-II are presented showing the use of these techniques to measure complex impedances.
- Published through SciTech Connect., 06/26/2001., "slac-pub-8884", and Teytelman, Dmitry.
- Type of Report and Period Covered Note:
- Funding Information:
View MARC record | catkey: 14686411