Actions for Simulating Electron Cloud Effects in Heavy-Ion Beams [electronic resource].
Simulating Electron Cloud Effects in Heavy-Ion Beams [electronic resource].
- Published
- Berkeley, Calif. : Lawrence Berkeley National Laboratory, 2004.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- vp : digital, PDF file
- Additional Creators
- Lawrence Berkeley National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- Stray electrons can be introduced in heavy ion fusion accelerators as a result of ionization of ambient gas or gas released from walls due to halo-ion impact, or as a result of secondary-electron emission. We summarize here results from several studies of electron-cloud accumulation and effects: (1) Calculation of the electron cloud produced by electron desorption from computed beam ion loss; the importance of ion scattering is shown; (2) Simulation of the effect of specified electron cloud distributions on ion beam dynamics. We find electron cloud variations that are resonant with the breathing mode of the beam have the biggest impact on the beam (larger than other resonant and random variations), and that the ion beam is surprisingly robust, with an electron density several percent of the beam density required to produce significant beam degradation in a 200-quadrupole system. We identify a possible instability associated with desorption and resonance with the breathing mode. (3) Preliminary investigations of a long-timestep algorithm for electron dynamics in arbitrary magnetic fields.
- Report Numbers
- E 1.99:lbnl--56056
lbnl--56056 - Subject(s)
- Other Subject(s)
- Note
- Published through SciTech Connect.
08/04/2004.
"lbnl--56056"
15th International Symposium on Heavy Ion Inertial Fusion, 2004, Princeton, NJ (US), 06/07/2004--06/11/2004.
Friedman, A.; Cohen, R.H.; Molvik, A.W.; Stoltz, P.; Veitzer, S.; Lund, S.W.; Azevedo, T.; Vay, J.-L. - Funding Information
- AC03-76SF00098
453401
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