Imaging spectroscopic analysis at the Advanced Light Source [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1999. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 18 pages : digital, PDF file
- Additional Creators:
- Lawrence Berkeley National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- One of the major advances at the high brightness third generation synchrotrons is the dramatic improvement of imaging capability. There is a large multi-disciplinary effort underway at the ALS to develop imaging X-ray, UV and Infra-red spectroscopic analysis on a spatial scale from. a few microns to 10nm. These developments make use of light that varies in energy from 6meV to 15KeV. Imaging and spectroscopy are finding applications in surface science, bulk materials analysis, semiconductor structures, particulate contaminants, magnetic thin films, biology and environmental science. This article is an overview and status report from the developers of some of these techniques at the ALS. The following table lists all the currently available microscopes at the. ALS. This article will describe some of the microscopes and some of the early applications.
- Published through SciTech Connect., 05/12/1999., "lbnl--43378", and Martin, M.C.; Lamble, G.M.; Anders, S.; McKinney, W.R.; Warwick, T.; Padmore, H.A.; MacDowell, A. A.
- Type of Report and Period Covered Note:
- Funding Information:
- AC03-76SF00098 and A805ES
View MARC record | catkey: 14688047