Measurement of subpicosecond electron pulse length [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1996. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 6 pages : digital, PDF file
- Additional Creators:
- Stanford Linear Accelerator Center, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility to characterize subpicosecond electron pulses. Using a far-infrared Michelson interferometer, this method measures the spectrum of coherent transition radiation emitted from electron bunches through optical autocorrelation. The electron bunch length is obtained from the measurement with a simple and systematic analysis which includes interference effects caused by the beam splitter. This method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods. The principle of this method and experimental results are discussed.
- Published through SciTech Connect., 04/01/1996., "slac-pub--7158", " conf-9605173--4", "DE96012579", 7. workshop on beam instrumentation, Argonne, IL (United States), 6-9 May 1996., and Lihn, Hung chi.
- Funding Information:
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