Determination of the resolution of the x-ray microscope XM-1 at beamline 6.1 [electronic resource].
- Berkeley, Calif. : Lawrence Berkeley National Laboratory, 1997.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- pages 2-5 : digital, PDF file
- Additional Creators:
- Lawrence Berkeley National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Resolution determination in x-ray microscopy is a complex issue which depends on many factors. Many different criteria and experimental setups are used to characterize resolution. Some of the important factors affecting resolution include the partial coherence and spectrum of the illumination. The purpose of this research has been to measure the resolution of XM-1 at beamline 6.1 taking into account these factors, and to compare the measurements to theoretical calculations. The x-ray microscope XM-1, built by the Center for X-ray Optics (CXRO), has been operational since 1994 at the Advanced Light Source at E.O. Lawrence Berkeley National Laboratory. It is of the conventional (i.e. full-field) type, utilizing zone plate optics. ALS bending magnet radiation is focused by a condenser zone plate onto a monochromator pinhole immediately in front of the sample. X-rays transmitted through the sample are focused by a micro-zone plate onto a CCD camera. The pinhole and the condenser with a central stop constitute a linear monochromator. The spectral distribution of the light illuminating the sample has been calculated assuming geometrical optics.
- Report Numbers:
- E 1.99:lbnl--39981
- Other Subject(s):
- Published through SciTech Connect.
Meyer-Ilse, W.; Attwood, D.T.; Heck, J.M.
- Funding Information:
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