Email RIS file
Bookmark
Report an Issue

High spatial resolution soft-x-ray microscopy [electronic resource].

Published
Berkeley, Calif. : Lawrence Berkeley National Laboratory, 1997.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
pages 6-9 : digital, PDF file
Additional Creators
Lawrence Berkeley National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
Access Online

Availability

I Want It
I Want It

Finding items...

Restrictions on Access
Free-to-read Unrestricted online access
Summary
A new soft x-ray microscope (XM-1) with high spatial resolution has been constructed by the Center for X-ray Optics. It uses bending magnet radiation from beamline 6.1 at the Advanced Light Source, and is used in a variety of projects and applications in the life and physical sciences. Most of these projects are ongoing. The instrument uses zone plate lenses and achieves a resolution of 43 nm, measured over 10% to 90% intensity with a knife edge test sample. X-ray microscopy permits the imaging of relatively thick samples, up to 10 μm thick, in water. XM-1 has an easy to use interface, that utilizes visible light microscopy to precisely position and focus the specimen. The authors describe applications of this device in the biological sciences, as well as in studying industrial applications including structured polymer samples.
Report Numbers
E 1.99:lbnl--39981
lbnl--39981
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
04/01/1997.
"lbnl--39981"
"DE97007345"
Brown, J.T.; Medecki, H.; Meyer-Ilse, W.
Funding Information
AC03-76SF00098
View MARC record | catkey: 14691201