Thermo-mechanical failure criteria for x-ray windows and filters and comparison with experiments [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1993. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 10 pages : digital, PDF file
- Additional Creators:
- Argonne National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- Synchrotron x-ray windows are vacuum separators and are usually made of thin beryllium metal. Filters are provided upstream of the window to filter out the soft x-rays to protect the window from overheating and failing. The filters are made of thin carbon products or sometimes beryllium, the same material as the window. Because the window is a vacuum separator, understanding its potential structural failure under thermal load is very important. Current structural failure models for the brazed windows and filters under thermal stresses are not very accurate. Existing models have been carefully examined and found to be inconsistent with the actual failure modes of windows tested. Due to the thinness of the filter/window, the most likely failure mode is thermal buckling. In fact, recent synchrotron tests conducted in Japan on window failures bear out this position. In this paper, failure criteria for filters/windows are proposed, and analyses are performed and compared with the experimental results from various sources. A consistent result is found between the analysis and reported experiments. A series of additional analyses based on the proposed failure criteria is also carried out for filter and window designs for the third generation synchrotron beamline front ends. Comparative results are presented here.
- Published through SciTech Connect., 07/01/1993., "anl/xfd/cp--78532", " conf-930722--10", "DE93017687", Annual meeting of the Society of Photo-Optical Instrumentation Engineers (SPIE),San Diego, CA (United States),11-16 Jul 1993., and Wang, Z.; Kuzay, T.M.
- Funding Information:
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