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Thermal imaging of synchrotron beams on silicon crystals [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy, 1992.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
Pages: (7 pages) : digital, PDF file
Additional Creators
Argonne National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
Advanced Photon source, a next generation synchrotron source, currently under construction at Argonne National Laboratory, will deliver large thermal loads of 1 to 10 kW to the first optical elements (usually a silicon crystal) in the synchrotron, x-ray beam lines. The first optical elements will distort and attenuate the x-ray beam if they are not extremely well cooled. An infrared camera is used to monitor the temperature distribution of the these first optical elements. This measurement is complicated because the silicon crystal is transparent to the infrared radiation and requires a special approach to the analysis of the data to get a meaningful temperature for the crystal.
Report Numbers
E 1.99:anl/cp-76582
E 1.99: conf-9207128--1
conf-9207128--1
anl/cp-76582
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Note
Published through SciTech Connect.
06/01/1992.
"anl/cp-76582"
" conf-9207128--1"
"DE92018182"
Quantitative infrared thermography, Chatillon Cedex (France), 7-9 Jul 1992.
Smither, R.K.
Funding Information
W-31109-ENG-38
View MARC record | catkey: 14695508