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Benchmarking the x-ray phase contrast imaging for ICF DT ice characterization using roughened surrogates [electronic resource].

Published:
Washington, D.C. : United States. Dept. of Energy, 2008.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description:
PDF-file: 15 pages; size: 5.2 Mbytes
Additional Creators:
Lawrence Berkeley National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary:
We use x-ray phase contrast imaging to characterize the inner surface roughness of DT ice layers in capsules planned for future ignition experiments. It is therefore important to quantify how well the x-ray data correlates with the actual ice roughness. We benchmarked the accuracy of our system using surrogates with fabricated roughness characterized with high precision standard techniques. Cylindrical artifacts with azimuthally uniform sinusoidal perturbations with 100 um period and 1 um amplitude demonstrated 0.02 um accuracy limited by the resolution of the imager and the source size of our phase contrast system. Spherical surrogates with random roughness close to that required for the DT ice for a successful ignition experiment were used to correlate the actual surface roughness to that obtained from the x-ray measurements. When comparing average power spectra of individual measurements, the accuracy mode number limits of the x-ray phase contrast system benchmarked against surface characterization performed by Atomic Force Microscopy are 60 and 90 for surrogates smoother and rougher than the required roughness for the ice. These agreement mode number limits are >100 when comparing matching individual measurements. We will discuss the implications for interpreting DT ice roughness data derived from phase-contrast x-ray imaging.
Report Numbers:
E 1.99:llnl-jrnl-405205
llnl-jrnl-405205
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Note:
Published through SciTech Connect.
06/26/2008.
"llnl-jrnl-405205"
Fusion Science and Technology, vol. 55, no. 3, April 1, 2009, pp. 260-268 55 3 FT
Koch, J; Moody, J; Atherton, J; Kozioziemski, B; Letts, S; Mapoles, E; Sater, J; Dewald, E; Montesanti, R; Nikroo, A; Youngblood, K.
Funding Information:
W-7405-ENG-48
View MARC record | catkey: 14738060