Warm, Dense Plasma Characterization by X-ray Thomson Scattering [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 2000.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 8p : digital, PDF file
- Additional Creators:
- Lawrence Berkeley National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Restrictions on Access:
- Free-to-read Unrestricted online access
- We describe how the powerful technique of spectrally resolved Thomson scattering can be extended to the x-ray regime, for direct measurements of the ionization state, density, temperature, and the microscopic behavior of dense cool plasmas. Such a direct measurement of microscopic parameters of solid density plasmas could eventually be used to properly interpret laboratory measurements of material properties such as thermal and electrical conductivity, EUS and opacity. In addition, x-ray Thomson scattering will provide new information on the characteristics of rarely and hitherto difficult to diagnose Fermi degenerate and strongly coupled plasmas.
- Report Numbers:
- E 1.99:ucrl-jc-138941
- Other Subject(s):
- Published through SciTech Connect.
26th European Conference on Laser Interaction with Matter, Praha, Czech Republic, Jun 12 - Jun 16, 2000.
Edwards, J E; Lee, R W; Landen, O L; Glenzer, S H; Cauble, R C; Degroot, J S.
- Funding Information:
View MARC record | catkey: 14740059