Electrical integrity of oxides in a radiation field [electronic resource].

Published: Oak Ridge, Tenn. : Oak Ridge National Laboratory, 1996.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description: pages 229-230 : digital, PDF file
Additional Creators: Oak Ridge National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information

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Summary

In the absence of an applied electric field, irradiation generally produces a decrease in the permanent (beam-off) electrical conductivity of ceramic insulators. However, in the past 6 years several research groups have reported a phenomenon known as radiation induced electrical degradation (RIED), which produces significant permanent increases in the electrical conductivity of ceramic insulators irradiated with an applied electric field. RIED has been reported to occur at temperatures between 420 and 800 K with applied electric fields as low as 20 V/mm.

Report Numbers

E 1.99:doe/er--0313/19
E 1.99: ornl/m--5023
ornl/m--5023
doe/er--0313/19

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Published through SciTech Connect.
04/01/1996.
"doe/er--0313/19"
" ornl/m--5023"
"DE96010874"
Zinkle, S.J.; Kinoshita, C.

View MARC record | catkey: 14743820