Diffractive coherence in multilayer dielectric gratings [electronic resource].
- Washington, D.C. : United States. Dept. of Energy, 1995. and Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
- Physical Description:
- 15 pages : digital, PDF file
- Additional Creators:
- Lawrence Livermore National Laboratory, United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
- Successful operation of large-scale high-power lasers, such as those in use and planned at LLNL and elsewhere, require optical elements that can withstand extremely high fluences without suffering damage. Of particular concern are dielectric diffraction gratings used for beam sampling and pulse compression. Laser induced damage to bulk dielectric material originates with coupling of the electric field of the radiation to bound electrons, proceeding through a succession of mechanisms that couple the electron kinetic energy to lattice energy and ultimately to macroscopic structural changes (e.g. melting). The constructive interference that is responsible for the diffractive behavior of a grating or the reflective properties of a multilayer dielectric stack can enhance the electric field above values that would occur in unstructured homogeneous material. Much work has been done to model damage to bulk matter. The presence of nonuniform electric fields, resulting from diffractive coherence, has the potential to affect damage thresholds and requires more elaborate theory. We shall discuss aspects of work directed towards understanding the influence of dielectric structures upon damage, with particular emphasis on computations and interpretation of electric fields within dielectric gratings and multilayer dielectric stacks, noting particularly the interference effects that occur in these structures.
- Published through SciTech Connect., 05/26/1995., "ucrl-jc--120189", " conf-9506238--1", "DE95016611", 7. Rochester conference on coherence and quantum optics, Rochester, NY (United States), 7-10 Jun 1995., and Shore, B.W.; Boyd, R.D.; Perry, M.D.; Britten, J.A.; Feit, M.D.; Li, Lifeng.
- Funding Information:
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