Actions for Forbidden lines of highly ionized ions for localized plasma diagnostics [electronic resource].
Forbidden lines of highly ionized ions for localized plasma diagnostics [electronic resource].
- Published
- Princeton, N.J. : Princeton University, 1980.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy. - Physical Description
- Pages: 20 : digital, PDF file
- Additional Creators
- Princeton University and United States. Department of Energy. Office of Scientific and Technical Information
Access Online
- Restrictions on Access
- Free-to-read Unrestricted online access
- Summary
- Numerous optically forbidden lines resulting from magnetic dipole transitions in low-lying electron configurations of highly ionized Fe, Ti and Cr atoms have been identified in PLT and PDX tokamak discharges, and applied for localized diagnostics in the high-temperature (0.5 to 3.0 keV) interior of these plasmas. The measurements include determination of local ion densities and their variation in time, and of ion motions (ion temperature, plasma rotations) through Doppler effect of the lines. These forbidden lines are particularly appropriate for such measurements because under typical tokamak conditions their emissivities are quite high (10/sup 11/ to 10/sup 14/ photons/cm/sup 3/-sec), and their relatively long wavelengths allow the use of intricate optical techniques and instrumentation. The spatial location of the emissivity is directly measurable, and tends to occur near radii where the ionization potential of the ion in question is equal to the local electron temperature. In future larger and presumably higher-temperature tokamaks analogous measurements with somewhat heavier atoms, particularly krypton, and perhaps zirconium appear both feasible and desirable.
- Report Numbers
- E 1.99:pppl-1669
E 1.99: conf-800320-4
conf-800320-4
pppl-1669 - Subject(s)
- Other Subject(s)
- Note
- Published through SciTech Connect.
06/01/1980.
"pppl-1669"
" conf-800320-4"
3. topical conference on high temperature plasma diagnostics, Los Angeles, CA, USA, 17 Mar 1980.
Suckewer, S.; Hinnov, E.; Fonck, R. - Funding Information
- AM02-76CH03073
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