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1999 IEEE International Integrated Reliability Workshop final report [electronic resource] : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
Conference Author
International Integrated Reliability Workshop (1999 : Lake Tahoe, Calif.)
Published
Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, c1999.
Physical Description
viii, 188 p. : ill. ; 28 cm.
Additional Creators
IEEE Electron Devices Society
and
IEEE Reliability Society
Access Online
serialssolutions.com
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Subject(s)
Integrated circuits
—
Reliability
—
Congresses
Integrated circuits
—
Wafer-scale integration
—
Reliability
—
Congresses
Genre(s)
Electronic books
ISBN
0780356497 (softbound)
Note
"IEEE Catalog No. 98TH8460."
Bibliography Note
Includes bibliographical references.
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