2007 IEEE International Conference on Microelectronic Test Structures [electronic resource] : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan / [sponsored by the IEEE Electron Devices Society].
- Conference Author:
- IEEE International Conference on Microelectronic Test Structures (20th : 2007 : University of Tokyo)
- Piscataway, NJ : IEEE, c2007.
- Physical Description:
- xv, 275 p. : ill. ; 30 cm.
- Additional Creators:
- IEEE Electron Devices Society
IEEE Xplore (Online service)
- Restrictions on Access:
- License restrictions may limit access.
- Related Titles:
- Microelectronic Test Structures, 2007, ICMTS '07, IEEE International Conference on.
- "IEEE catalog number: 07CH37856".
"... International Conference on Microelectronic Test Structures (ICMTS 2007) ... is the 20th anniversary of the ICMTS"--P. ii.
- Bibliography Note:
- Includes bibliographical references and index.
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