Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 [electronic resource] : 5-9 July, 1999, Orchard Hotel, Singapore] / edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].
- Conference Author:
- International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th : 1999 : Singapore)
- Additional Titles:
- Physical & failure analysis of integrated circuites
7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
- Piscataway, New Jersey : IEEE, c1999.
- Physical Description:
- 209 p. : ill. ; 30 cm.
- Additional Creators:
- Chim, Wai Kin
Radhakrishnan, M. K.
Thong, John T. L.
IEEE Reliability/CPMT/ED Singapore Chapter
- Restrictions on Access:
- License restrictions may limit access.
- 0780351878 (siftbound)
- "IPFA '99 proceedings"--Cover.
"IEEE Catalog Number 99TH8394"--verso of T.p.
Issues for 18th (2011)- cataloged as a serial in LC.
- Bibliography Note:
- Includes bibliographic references and author index.
View MARC record | catkey: 14786241