Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California [electronic resource] / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI in cooperation with the IEEE Solid State Circuits Council
- Conference Author:
- IEEE International Workshop on Memory Technology, Design, and Testing (1995 : San Jose, Calif.)
- Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
- Physical Description:
- ix, 129 p. : ill. ; 28 cm.
- Additional Creators:
- Rajsuman, Rochit, Rajkanan, K. (Kamal), IEEE Computer Society. Test Technology Technical Committee, IEEE Computer Society. Technical Committee on VLSI, and IEEE Solid-State Circuits Council
- Restrictions on Access:
- License restrictions may limit access.
- "IEEE catalog number 95TH8065"--T.p. verso.
- Bibliography Note:
- Includes bibliographical references and index.
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