Actions for Lifetime Prediction for Degradation of Solar Mirrors using Step-Stress Accelerated Testing (Presentation) [electronic resource].

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Lifetime Prediction for Degradation of Solar Mirrors using Step-Stress Accelerated Testing (Presentation) [electronic resource].

Published
Washington, D.C. : United States. Dept. of Energy, 2011.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
22 pages : digital, PDF file
Additional Creators
National Renewable Energy Laboratory (U.S.), United States. Department of Energy, and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
This research is to illustrate the use of statistical inference techniques in order to quantify the uncertainty surrounding reliability estimates in a step-stress accelerated degradation testing (SSADT) scenario. SSADT can be used when a researcher is faced with a resource-constrained environment, e.g., limits on chamber time or on the number of units to test. We apply the SSADT methodology to a degradation experiment involving concentrated solar power (CSP) mirrors and compare the results to a more traditional multiple accelerated testing paradigm. Specifically, our work includes: (1) designing a durability testing plan for solar mirrors (3M's new improved silvered acrylic "Solar Reflector Film (SFM) 1100") through the ultra-accelerated weathering system (UAWS), (2) defining degradation paths of optical performance based on the SSADT model which is accelerated by high UV-radiant exposure, and (3) developing service lifetime prediction models for solar mirrors using advanced statistical inference. We use the method of least squares to estimate the model parameters and this serves as the basis for the statistical inference in SSADT. Several quantities of interest can be estimated from this procedure, e.g., mean-time-to-failure (MTTF) and warranty time. The methods allow for the estimation of quantities that may be of interest to the domain scientists.
Report Numbers
E 1.99:nrel/pr-2c00-52658
nrel/pr-2c00-52658
Subject(s)
Other Subject(s)
Note
Published through SciTech Connect.
09/01/2011.
"nrel/pr-2c00-52658"
Presented at the 2011 Workshop on Accelerated Stress Testing and Reliability, 28-30 September 2011, San Francisco, California.
Lee, J.; Kennedy, C.; Jones, W.; Elmore, R.; Gray, M.
Funding Information
AC36-08GO28308
View MARC record | catkey: 14795513