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Helium trapping in aluminum and sintered aluminum powders [electronic resource].

Published
Argonne, Ill. : Argonne National Laboratory, 1975.
Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy.
Physical Description
Pages: 8 : digital, PDF file
Additional Creators
Argonne National Laboratory and United States. Department of Energy. Office of Scientific and Technical Information
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Summary
The surface erosion of annealed aluminum and of sintered aluminum powder (SAP) due to blistering from implantation of 100-keV $sup 4$He$sup +$ ions at room temperature has been investigated. A substantial reduction in the blistering erosion rate in SAP was observed from that in pure annealed aluminum. In order to determine whether the observed reduction in blistering is due to enhanced helium trapping or due to helium released, the implanted helium profiles in annealed aluminum and in SAP have been studied by Rutherford backscattering. The results show that more helium is trapped in SAP than in aluminum for identical irradiation conditions. The observed reduction in erosion from helium blistering in SAP is more likely due to the dispersion of trapped helium at the large Al-Al$sub 2$O$sub 3$ interfaces and at the large grain boundaries in SAP than to helium release. (auth)
Report Numbers
E 1.99:conf-750949--9
conf-750949--9
Subject(s)
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Note
Published through SciTech Connect.
01/01/1975.
"conf-750949--9"
International conference on ion beam surface layer analysis, Karlsruhe, F.R. Germany, 15 Sep 1975.
Das, S.K.; Kaminsky, M.; Rossing, T.
Funding Information
W-31-109-ENG-38
View MARC record | catkey: 14988205