A Comparison of Three-Dimensional Simulations of Traveling-Wave Tube Cold-Test Characteristics Using CST MICROWAVE STUDIO and MAFIA
- Author:
- Herrmann, K. A.
- Published:
- [2001].
- Physical Description:
- 1 electronic document
- Additional Creators:
- Cross, A. W., Wilson, J. D., Williams, W. D., Chevalier, C. T., and Kory, C. L.
Online Version
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- Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access - Summary:
- Previously, it was shown that MAFIA (solutions of Maxwell's equations by the Finite Integration Algorithm), a three-dimensional simulation code, can be used to produce accurate cold-test characteristics including frequency-phase dispersion, interaction impedance, and attenuation for traveling-wave tube (TWT) slow-wave structures. In an effort to improve user-friendliness and simulation time, a model was developed to compute the cold-test parameters using the electromagnetic field simulation software package CST MICROWAVE STUDIO (MWS). Cold-test parameters were calculated for several slow-wave circuits including a ferruled coupled-cavity, a folded waveguide, and a novel finned-ladder circuit using both MWS and MAFIA. Comparisons indicate that MWS provides more accurate cold-test data with significantly reduced simulation times. Both MAFIA and MWS are based on the finite integration (FI) method; however, MWS has several advantages over MAFIA. First, it has a Windows based interface for PC operation, making it very user-friendly, whereas MAFIA is UNIX based. MWS uses a new Perfect Boundary Approximation (PBA), which increases the accuracy of the simulations by avoiding stair step approximations associated with MAFIA's representation of structures. Finally, MWS includes a Visual Basic for Applications (VBA) compatible macro language that enables the simulation process to be automated and allows for the optimization of user-defined goal functions, such as interaction impedance.
- Other Subject(s):
- Collection:
- NASA Technical Reports Server (NTRS) Collection.
- Note:
- Document ID: 20020027536.
IEEE International Vacuum Electronics Conference; 23-25 Apr. 2002; Monterey, CA; United States. - Terms of Use and Reproduction:
- No Copyright.
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