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Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell

Author: Chakradhar, Srimat T.
Published: Boston : Kluwer Academic Publishers, [1991]
Copyright Date: ©1991
Physical Description: xii, 184 pages : illustrations ; 25 cm.
Additional Creators: Agrawal, Vishwani D., 1943- and Bushnell, Michael L. (Michael Lee), 1950-

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Series

Kluwer international series in engineering and computer science ; SEC 140
Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing

Subject(s)

ISBN

0792391659 (acid-free paper)

Bibliography Note

Includes bibliographical references and index.

View MARC record | catkey: 1562034