Material Measurements Using Groundplane Apertures
- Komisarek, K.
- Oct. 1995.
- Physical Description:
- 1 electronic document
- Additional Creators:
- Wang, N. and Dominek, A.
- hdl.handle.net , Connect to this object online.
- Restrictions on Access:
- Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
- A technique for material parameter determination using an aperture in a groundplane is studied. The material parameters are found by relating the measured reflected field in the aperture to a numerical model. Two apertures are studied which can have a variety of different material configurations covering the aperture. The aperture cross-sections studied are rectangular and coaxial. The material configurations involved combinations of single layer and dual layers with or without a resistive exterior resistive sheet. The resistivity of the resistive sheet can be specified to simulate a perfect electric conductor (PEC) backing (0 Ohms/square) to a free space backing (infinity Ohms/square). Numerical parameter studies and measurements were performed to assess the feasibility of the technique.
- Other Subject(s):
- NASA Technical Reports Server (NTRS) Collection.
- Document ID: 19960015532.
Accession ID: 96N21423.
- No Copyright.
View MARC record | catkey: 15651351