Holt film wall shear instrumentation for boundary layer transition research
- Schneider, Steven P.
- Jul 18, 1994.
- Physical Description:
- 1 electronic document
- Restrictions on Access:
- Unclassified, Unlimited, Publicly available.
- Measurements of the performance of hot-film wall-shear sensors were performed to aid development of improved sensors. The effect of film size and substrate properties on the sensor performance was quantified through parametric studies carried out both electronically and in a shock tube. The results show that sensor frequency response increases with decreasing sensor size, while at the same time sensitivity decreases. Substrate effects were also studied, through parametric variation of thermal conductivity and heat capacity. Early studies used complex dual-layer substrates, while later studies were designed for both single-layer and dual-layer substrates. Sensor failures and funding limitations have precluded completion of the substrate thermal-property tests.
- NASA Technical Reports Server (NTRS) Collection.
- Document ID: 19940032552.
Accession ID: 94N37060.
- No Copyright.
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