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- Unclassified, Unlimited, Publicly available.
- A new method is described, including results, to measure, control, and follow containerless processing in ground based levitators. This technique enables instantaneous optical property measurements from a transient solid or liquid surface concurrent with true temperature measurement. This was used successfully as a diagnostic tool to follow processing of Al, Si, and Ti during electromagnetic levitation. Experiments on Al show the disappearance of the oxide (emittance 0.33) at ca. 1300 C leaving a liquid surface with an emittance of 0.06. Electromagnetic levitation of silicon shows a liquid with a constant emittance (0.2) but with a solid whose emittance decreases very rapidly with increasing temperature. Consequently, the processing of materials at high temperatures can be controlled quite well through the control of surface optical properties.
- NASA Technical Reports Server (NTRS) Collection.
- Document ID: 19910012053.
Accession ID: 91N21366.
JPL, Proceedings of the First Workshop on Containerless Experimentation in Microgravity; p 379-38.
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