Limitations of current analytic techniques in estimating the reliability of life-critical electronics systems are discussed. A new framework for specification of recovery and fault-handling submodels is suggested, and is shown through several examples to provide substantially improved modeling accuracy and flexibility. Implementation of the new technique in an X-windows based system, XHARP, is also described. The implementation allows for an automated behavioral decomposition of full system models, heretofore unavailable in such tools.