- Restrictions on Access:
- Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
- An in situ fatigue loading stage inside a scanning electron microscope (SEM) was used to determine the fatigue crack growth behavior of a PWA 1480 single-crystal nickel-based superalloy. The loading stage permits real-time viewing of the fatigue damage processes at high magnification. The PWA 1480 single-crystal, single-edge notch specimens were tested with the load axis parallel to the (100) orientation. Two distinct fatigue failure mechanisms were identified. The crack growth rate differed substantially when the failure occurred on a single slip system in comparison to multislip system failure. Two processes by which crack branching is produced were identified and are discussed. Also discussed are the observed crack closure mechanisms.
- Other Subject(s):
- NASA Technical Reports Server (NTRS) Collection.
- Document ID: 19880013602.
Accession ID: 88N22986.
- No Copyright.
View MARC record | catkey: 15694873