Actions for Causes of spurious features in spectral reflectance data
Causes of spurious features in spectral reflectance data
- Author
- King, Trude V. V.
- Published
- Aug 15, 1987.
- Physical Description
- 1 electronic document
- Additional Creators
- Clark, Roger N.
Online Version
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- Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access - Summary
- Several techniques are becoming common in the analysis of imaging spectrometer data that can lead to spurious absorption features or to changes in the position, width, and shape of actual absorption features. It is a common practice to calibrate AIS or other imaging spectrometer data by averaging each pixel along the flight line. The average is used to calibrate the spectral data by dividing the spectrum at each pixel by the average. If some pixels in the data set contain an absorption, then the average will also show an absorption. Some AIS data has had problems with wavelength stability from one scan line to the next which can produce spurious features with some analysis methods. If a pixel has a spectrum with an absorption having a different position or width than the spectrum used in a ratio, then the ratio can produce a spurious absorption at a different position and width than the true absorption feature. An average spectrum ratioed to each pixel will produce band shifts, and changes in width or shape. If continuum removal is performed by substraction rather than division, band positions can also be shifted.
- Other Subject(s)
- Collection
- NASA Technical Reports Server (NTRS) Collection.
- Note
- Document ID: 19880004387.
Accession ID: 88N13769.
JPL Proceedings of the 3rd Airborne Imaging Spectrometer Data Analysis Workshop 132-137 (SEE N88-13755 05-42); JPL Proceedings of t. - Terms of Use and Reproduction
- No Copyright.
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