Actions for Detection of reflector surface error from near-field data : Effect of edge diffracted field

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Detection of reflector surface error from near-field data : Effect of edge diffracted field

Author
Acosta, Roberto J.
Published
JAN 1, 1987.
Physical Description
1 electronic document
Additional Creators
Cherrette, Alan R. and Lee, Shong W.
Online Version

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Unclassified, Unlimited, Publicly available.
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Summary
The surface accuracy of large reflector antennas must be maintained within certain tolerances if high gain/low sidelobe performance is to be achieved. Thus the measurement of the surface profile is an important part of the quality control procedure when constructing antennas of this type. An efficient method for surface profile measurement has been proposed, i.e., the reflector surface is calculated from the measured near-field phase data using the theory of geometric optics. For a surface profile calculation of this kind, it is necessary to know the margin of error built into the method of calculation. This will enable a specification of the tolerance from which the surface profile can be determined. When calculating the surface profile from near-field phase data, there are two main sources of error. The first is the measurement error in near-field phase data. The second arises from the edge diffracted fields that are superimposed on the reflected fields in the measured near-field data. The error in the calculated surface profile produced by the edge diffracted fields is examined.
Other Subject(s)
Collection
NASA Technical Reports Server (NTRS) Collection.
Note
Document ID: 19870013441.
Accession ID: 87N22874.
NASA-TM-89920.
NAS 1.15:89920.
E-3616.
Terms of Use and Reproduction
No Copyright.
View MARC record | catkey: 15699069