- Restrictions on Access:
- Unclassified, Unlimited, Publicly available.
- A novel method of mounting thin samples for electrical measurements is described. A vacuum chuck holds a mounting plate, which, in turn, holds the sample. Contacts on the mounting plate establish electrical connection to the sample. The attachment of wires directly to the samples is unnecessary. Measurements can be made at temperatures from 77 to 1000 K. As an application of the apparatus, resistivity and Hall measurements of a thin silicon carbide sample are presented.
- Document ID: 19860015488.
Accession ID: 86N24959.
- No Copyright.
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