Email RIS file
Bookmark
Report an Issue

Investigation of accelerated stress factors and failure/degradation mechanisms in terrestrial solar cells

Author
Lathrop, J. W.
Published
Sep 1, 1984.
Physical Description
1 electronic document
Online Version

Availability

I Want It
I Want It

Finding items...

Restrictions on Access
Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
Summary
Research on the reliability of terrestrial solar cells was performed to identify failure/degradation modes affecting solar cells and to relate these to basic physical, chemical, and metallurgical phenomena. Particular concerns addressed were the reliability attributes of individual single crystalline, polycrystalline, and amorphous thin film silicon cells. Results of subjecting different types of crystalline cells to the Clemson accelerated test schedule are given. Preliminary step stress results on one type of thin film amorphous silicon (a:Si) cell indicated that extraneous degradation modes were introduced above 140 C. Also described is development of measurement procedures which are applicable to the reliability testing of a:Si solar cells as well as an approach to achieving the necessary repeatability of fabricating a simulated a:Si reference cell from crystalline silicon photodiodes.
Other Subject(s)
Collection
NASA Technical Reports Server (NTRS) Collection.
Note
Document ID: 19850011214.
Accession ID: 85N19524.
DOE/JPL-954929-84/11.
AR-5.
DRD-SE-7.
NASA-CR-175469.
NAS 1.26:175469.
Terms of Use and Reproduction
No Copyright.
View MARC record | catkey: 15705567