Data acquisition techniques for exploiting the uniqueness of the time-of-flight mass spectrometer : Application to sampling pulsed gas systems
- Lincoln, K. A.
- Aug 1, 1980.
- Physical Description:
- 1 electronic document
- Restrictions on Access:
- Unclassified, Unlimited, Publicly available.
Free-to-read Unrestricted online access
- Mass spectra are produced in most mass spectrometers by sweeping some parameter within the instrument as the sampled gases flow into the ion source. It is evident that any fluctuation in the gas during the sweep (mass scan) of the instrument causes the output spectrum to be skewed in its mass peak intensities. The time of flight mass spectrometer (TOFMS) with its fast, repetitive mode of operation produces spectra without skewing or varying instrument parameters and because all ion species are ejected from the ion source simultaneously, the spectra are inherently not skewed despite rapidly changing gas pressure or composition in the source. Methods of exploiting this feature by utilizing fast digital data acquisition systems, such as transient recorders and signal averagers which are commercially available are described. Applications of this technique are presented including TOFMS sampling of vapors produced by both pulsed and continuous laser heating of materials.
- NASA Technical Reports Server (NTRS) Collection.
- Document ID: 19800023268.
Accession ID: 80N31775.
Dyn. Mass Spectrometry Symp.; 7-10 July 1980; Canterbury.
- No Copyright.
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